Viewing 241 - 255 of 553
Method and Apparatus for Analysing and Modeling of Analog Systems
Peng Li (Carnegie Mellon Univ.); Lawrence Pileggi (Carnegie Mellon Univ.)Patent Expired
Application Type: European Patent Office
Method and Apparatus for Controlling Rapid Thermal Processing Systems
Ronald S. Gyurcsik (NC State); John A. Harris (NC State); F. Yates Sorrell (NC State)Patent Expired
Application Type: Utility
Method and Apparatus for Coupling a Microwave Source in an Electron Cyclotron Resonance System
Joseph Cecchi (Princeton); Patrick Colestock (Princeton); James E. Stevens (Princeton)Patent Expired
Application Type: Utility
Method and Apparatus for Dual Modulation Laser Spectroscopy
Hoi Cheong Sun (Stevens IT); Ed Whittaker (Stevens IT)Patent Expired
Application Type: Continuation (in part)
Method and Apparatus for High Speed Digital Sampling of a Data Signal
Ralph K. Cavin (NC State); C. Thomas Gray (NC State); Thomas A. Hughes (NC State); Wentai Liu (NC State)Patent Expired
Application Type: Utility
Method and Apparatus for Real-Time Speckle Interferometry for Strain or Displacement of an Object Surface
Steven Brueck (Univ. of New Mexico); David Burckel (Univ. of New Mexico); Andrew Frauenglass (Univ. of New Mexico); Mike K. Lang (Univ. of New Mexico); Saleem Zaidi (Univ. of New Mexico)Patent Expired
Application Type: Utility
Method and Apparatus for Reducing Fringe Interference in Laser Spectroscopy
Hoi Cheong Sun (Stevens IT); Ed Whittaker (Stevens IT)Patent Expired
Application Type: Continuation (in part)
Method and Apparatus for Simulating a Microelectric Interconnect Circuit
Nanda Gopal (UT/Austin); Lawrence Pileggi (UT/Austin); Curtis Ratzlaff (UT/Austin)Patent Expired
Application Type: Utility
Method and Apparatus for Simulating a Microelectronic Circuit
J. Eric Bracken (Carnegie Mellon Univ.); Vivek Raghavan (Carnegie Mellon Univ.); Ronald Rohrer (Carnegie Mellon Univ.)Patent Expired
Application Type: Utility
Method and Means for Reducing Speckle in Coherent Laser Pulses
William G. Oldham (UC/Berkeley); William N. Partlo (UC/Berkeley)Patent Expired
Application Type: Utility
Method for Automatically Generating Test Vectors for Digital Integrated Circuits
Thomas M. Niermann (UIUC); Janak H. Patel (UIUC)Patent Expired
Application Type: Utility
Method for Diagnosing Bridging Faults in Integrated Circuits
Brian Chess (UC/Santa Cruz); F. Joel Ferguson (UC/Santa Cruz); Tracy Larrabee (UC/Santa Cruz); David B. Lavo (UC/Santa Cruz)Patent Expired
Application Type: Utility
Method for Fabricating a Triple Self-Aligned Bipolar Junction Transistor
Rashid Bashir (Purdue); Gerold W. Neudeck (Purdue)Patent Expired
Application Type: Divisional
Method for Fine-Line Interferometric Lithography
Steven Brueck (Univ. of New Mexico); An-Shyang Chu (Univ. of New Mexico); Saleem Zaidi (Univ. of New Mexico)Patent Expired
Application Type: Utility
Method for Forming a Layer of Uniform Thickness On a Semiconductor Wafer During Rapid Thermal Processing
Mehmet Ozturk (NC State); Mahesh Sanganeria (NC State)Patent Expired
Application Type: Utility