[x]
GRC Science Area
CADTS – Computer Aided Design & Test Sciences
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1 through 7 of
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- 1:
E003932 - Variability Forum - McAndrew
- Variability Modeling at the Device Level for Circuit Simulation First International Variability Characterization Workshop April 30, 2010 Freescale Semiconductor Colin McAndrew ...
URL: https://www.src.org/...dar/e003932/e003932_s1_2_mcandrew.pdf
Modified: 2010-06-29 - 1.1MB Find Similar Documents
- 2:
E003932 - Variability Forum - Nowka
- Test Structures for Variability Characterization Kevin Nowka IBM Research - Austin nowka@us.ibm.com IBM Research Worldwide Watson Almaden Zurich Beijing Haifa Austin Tokyo Delhi ...
URL: https://www.src.org/calendar/e003932/e003932_s1_3_nowka.pdf
Modified: 2010-06-29 - 1.4MB Find Similar Documents
- 3:
E003932 - Variability Forum - Gupta
- NanoCAD Lab Modeling Performance Impact of Variability Puneet Gupta Dept. of EE, University of California Los Angeles (puneet@ee.ucla.edu) Work partly supported by NSF, UC ...
URL: https://www.src.org/calendar/e003932/e003932_s2_2_gupta.pdf
Modified: 2010-06-29 - 1.4MB Find Similar Documents
- 4:
E003932 - Variability Forum - Cao
- Predictive Variability Predictive Variability Modeling Modeling Predictive Variability Predictive Variability Modeling Modeling d D i I li ti d D i I li ti and Design Implications ...
URL: https://www.src.org/calendar/e003932/e003932_s2_3_cao.pdf
Modified: 2010-06-29 - 2.6MB Find Similar Documents
- 5:
E003932 - Variability Forum - Chuang_Su
- C. T. Chuang and P. Su, 04/2010 Variability and Design of SRAM in Scaled and Emerging Technologies Ching-Te Chuang and Pin Su Department of Electronics Engineering and Institute of ...
URL: https://www.src.org/...ar/e003932/e003932_s3_1_chuang_su.pdf
Modified: 2010-06-29 - 1.8MB Find Similar Documents
- 6:
E003932 - Variability Forum - Asenov.ppt
- A. Asenov James Watt Professor of Electrical Engineering Device Modelling Group University of Glasgow www.elec.gla.ac.uk/groups/dev_mo CEO Gold Standard Simulation, Ltd. After K. ...
URL: https://www.src.org/calendar/e003932/e003932_s1_1_asenov.pdf
Modified: 2010-06-29 - 7.6MB Find Similar Documents
- 7:
Vertically Integrated Test/Calibration and Reliability Enhancement...
- Vertically Integrated Test/Calibration and Reliability Test/Calibration and Reliability Enhancement for Systems with RF/Analog Content RF/Analog Content Sule Ozev Sule.ozev@asu.edu ...
URL: https://www.src.org/calendar/e004025/ozev.pdf
Modified: 2010-07-19 - 54KB Find Similar Documents
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