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- 1:
FAQs About the Focus Center Research Program - SRC
- FAQs About the Focus Center Research Program (FCRP) FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics ...
URL: https://www.src.org/program/fcrp/about/faq/
Modified: 2010-06-26 - 29KB
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- 2:
Semiconductor Research Corporation - SRC
- FCRP FCRP Focus Center Research Program (Legacy) Multi-Scale Systems Research Center Creation of a comprehensive and a systematic solution to the distributed multi-scale system ...
URL: https://www.src.org/program/fcrp/
Modified: 2023-10-10 - 32KB
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- 3:
Focus Center Research Program Overview - SRC
- Focus Centers FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now being sponsored by ...
URL: https://www.src.org/program/fcrp/centers/
Modified: 2010-06-21 - 24KB
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- 4:
FCRP - About - SRC
- About Focus Center Research Program FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now ...
URL: https://www.src.org/program/fcrp/about/
Modified: 2010-06-27 - 22KB
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- 5:
In-situ Studies of III-V Surfaces and High-k Atomic Layer Deposition...
- In-situ Studies of III-V Surfaces and High-k Atomic Layer Deposition Date: Tuesday, Oct. 23, 2012, 4 p.m.-5:30 p.m. ET Location: via web conference, Research Triangle Park, NC, ...
URL: https://www.src.org/calendar/e004519/
Modified: 2013-04-23 - 32KB
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- 6:
 Past
- PAST FCRP workshop - M Mayberry, May 2012 Source: SRC website, Feb 2011 FCRP workshop - M Mayberry, May 2012 system software systems systems structures structures materials ...
URL: https://www.src.org/calendar/e004827/mayberry.pdf
Modified: 2012-05-16 - 3.4MB
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- 7:
3D IC University Research e-Workshop (Event E004357) - SRC
- 3D IC University Research e-Workshop Date: Thursday, May 5, 2011, noon-4:30 p.m. ET Location: SRC Conference Room D; via web conference, Research Triangle Park, NC, United States ...
URL: https://www.src.org/calendar/e004357/
Modified: 2011-11-05 - 43KB
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- 8:
Carbon Electronics Workshop (Event E003973) - SRC
- Carbon Electronics Workshop Date: Tuesday, Sept. 21, 2010, 9 a.m. - Wednesday, Sept. 22, 2010, 1 p.m. ET Location: NanoFab 300, South Auditorium, CSNE, University of Albany-SUNY, ...
URL: https://www.src.org/calendar/e003973/
Modified: 2011-03-22 - 83KB
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- 9:
Proposers' Conference for the Focus Center Research Program ...
- Proposers' Conference for the Focus Center Research Program Date: Monday, May 14, 2012, 11:30 a.m.-4 p.m. CT Location: Hyatt Regency DFW, Enterprise 7 & 8, Dallas, TX, United ...
URL: https://www.src.org/calendar/e004827/
Modified: 2012-11-14 - 49KB
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- 10:
FCRP Proposers' Conference
- FCRP Proposers' Conference Welcome!! Thank you for your interest! Objectives of this event: Learning and Teaming! Hearing perspectives from DARPA and Industry regarding ...
URL: https://www.src.org/calendar/e004827/weitzman.pdf
Modified: 2012-05-16 - 58KB
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- 11:
Carbon-based Electronics Workshop (Event E004815) - SRC
- Carbon-based Electronics Workshop Date: Thursday, Sept. 20, 2012, 5 p.m. - Friday, Sept. 21, 2012, 4 p.m. ET Location: Massachusetts Institute of Technology, Building E15, ...
URL: https://www.src.org/calendar/e004815/
Modified: 2013-03-21 - 25KB
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- 12:
FCRP Program Mission and Description - SRC
- FCRP Program Mission FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now being sponsored ...
URL: https://www.src.org/program/fcrp/about/mission/
Modified: 2010-06-21 - 22KB
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- 13:
About Interconnect - SRC
- About Interconnect Research at IFC FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now ...
URL: https://www.src.org/program/fcrp/ifc/about/
Modified: 2010-06-21 - 23KB
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- 14:
Comparator-Based Switched Capacitor Circuit for Scaled Semiconductor...
- Comparator-Based Switched Capacitor Circuit for Scaled Semiconductor Fabrication Processes Application Type: Utility Patent Number: 7319425 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0473/
Modified: 2008-01-15 - 21KB
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- 15:
Surface and Gas Phase Doping of III-V Semiconductors (Patent...
- Surface and Gas Phase Doping of III-V Semiconductors Application Type: Utility Patent Number: 8697467 Country: United States Status: Filed on 26-Jul-2010, Issued on 15-Apr-2014, ...
URL: https://www.src.org/library/patent/p1227/
Modified: 2014-04-15 - 23KB
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- 16:
FCRP: Members - SRC
- Our Members Are Leading the Pack FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now ...
URL: https://www.src.org/program/fcrp/about/membership/
Modified: 2010-06-21 - 22KB
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- 17:
FCRP Newsletter Archive - SRC
- iNFOCUS, the FCRP Monthly Newsletter FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now ...
URL: https://www.src.org/program/fcrp/newsletter/
Modified: 2012-03-28 - 24KB
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- 18:
Semiconductor on Insulator (XOI) for High Performance Field Effect...
- Semiconductor on Insulator (XOI) for High Performance Field Effect Transistors Application Type: Utility Patent Number: 8525228 Country: United States Status: Filed on 1-Jul-2011, ...
URL: https://www.src.org/library/patent/p1245/
Modified: 2013-09-03 - 23KB
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- 19:
About Circuit Design - SRC
- About Circuit Design Research at C2S2 FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now ...
URL: https://www.src.org/program/fcrp/c2s2/about/
Modified: 2010-06-21 - 25KB
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- 20:
Multi-Layer Semiconductor Structure Incorporating an Interference...
- Multi-Layer Semiconductor Structure Incorporating an Interference Shielding Portion Application Type: Utility Patent Number: 7067909 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0435/
Modified: 2006-06-27 - 21KB
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- 21:
Method of Forming a Multi-Layer Semiconductor Structure Having...
- Method of Forming a Multi-Layer Semiconductor Structure Having a Seam-Less Bonding Interface Application Type: Utility Patent Number: 7064055 Country: United States Status: Filed ...
URL: https://www.src.org/library/patent/p0434/
Modified: 2006-06-20 - 22KB
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- 22:
Method of Forming a Multi-Layer Semiconductor Structure Incorporating...
- Method of Forming a Multi-Layer Semiconductor Structure Incorporating a Processing Handle Member Application Type: Utility Patent Number: 7307003 Country: United States Status: ...
URL: https://www.src.org/library/patent/p0575/
Modified: 2007-12-11 - 22KB
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- 23:
Semiconductor Light-Emitting Structure and Graded-Composition...
- Semiconductor Light-Emitting Structure and Graded-Composition Substrate Providing Yellow-Green Light Emission Application Type: Utility Patent Number: 8063397 Country: United ...
URL: https://www.src.org/library/patent/p1020/
Modified: 2011-11-22 - 22KB
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- 24:
Thin Membrane Alignment Using Patterned Nanomagnets (Patent P0647...
- Thin Membrane Alignment Using Patterned Nanomagnets Application Type: Utility Patent Number: 7644489 Country: United States Status: Filed on 31-Aug-2006, Issued on 12-Jan-2010, ...
URL: https://www.src.org/library/patent/p0647/
Modified: 2010-01-12 - 21KB
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- 25:
Interferometric Optical Tomography (Patent P0532) - SRC
- Interferometric Optical Tomography Application Type: Utility Patent Number: 7352474 Country: United States Status: Filed on 21-Jan-2005, Issued on 1-Apr-2008, Patent Abandoned ...
URL: https://www.src.org/library/patent/p0532/
Modified: 2008-04-01 - 21KB
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- 26:
Compliant Off-Chip Interconnects (Patent P0341) - SRC
- Compliant Off-Chip Interconnects Application Type: Utility Patent Number: 6784378 Country: United States Status: Filed on 25-Feb-2002, Issued on 31-Aug-2004, Patent Abandoned ...
URL: https://www.src.org/library/patent/p0341/
Modified: 2004-08-31 - 21KB
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- 27:
Production Test Technique for RF Circuits Using Embedded Test...
- Production Test Technique for RF Circuits Using Embedded Test Sensors Application Type: Utility Patent Number: 7554335 Country: United States Status: Filed on 18-May-2006, Issued ...
URL: https://www.src.org/library/patent/p0595/
Modified: 2009-06-30 - 21KB
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- 28:
About System Design at GSRC - SRC
- About System Design Research at GSRC FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now ...
URL: https://www.src.org/program/fcrp/gsrc/about/
Modified: 2010-06-21 - 22KB
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- 29:
About Complex Systems Design - SRC
- About Complex Systems Design Research at MuSyC FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics ...
URL: https://www.src.org/program/fcrp/musyc/about/
Modified: 2010-06-21 - 22KB
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- 30:
Performing Retardation Measurements (Patent P0511) - SRC
- Performing Retardation Measurements Application Type: Utility Patent Number: 7224457 Country: United States Status: Filed on 24-Sep-2004, Issued on 29-May-2007, Patent Abandoned ...
URL: https://www.src.org/library/patent/p0511/
Modified: 2007-05-29 - 21KB
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