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Thrust/Theme
TT – Test & Testability
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- 1:
 Slide 1
- Third Annual India Design Review January 7-8, 2015 William H. Joyner, Jr. CADTS William.Joyner@src.org David C. Yeh ICSS David.Yeh@src.org Restricted Distribution: Contains SRC ...
URL: https://www.src.org/...r/e005563/2015_indiawelcome_final.pdf
Modified: 2015-02-04 - 319KB
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- 2:
Semiconductor Research Corporation - SRC
- GRC GRC Global Research Collaboration Our motivation is to fund the most relevant and critical research for international companies, so we go where the best university talent ...
URL: https://www.src.org/program/grc/
Modified: 2023-10-10 - 33KB
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- 3:
India Design Review (Event E005563) - SRC
- India Design Review Date: Wednesday, Jan. 7, 2015, 6 p.m. - Thursday, Jan. 8, 2015, 5 p.m. Local Location: Hyatt Bangalore, 1/1, Swami Vivekananda Road, Off M.G. Road, Ulsoor, ...
URL: https://www.src.org/calendar/e005563/
Modified: 2015-02-04 - 82KB
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- 4:
Systems and Methods for Testing Integrated Circuits (Patent P0342...
- Systems and Methods for Testing Integrated Circuits Application Type: Utility Patent Number: 7032151 Country: United States Status: Filed on 13-Nov-2002, Issued on 18-Apr-2006, ...
URL: https://www.src.org/library/patent/p0342/
Modified: 2006-04-18 - 22KB
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- 5:
Method for Testing Analog and Mixed-Signal Circuits Using Functionally...
- Method for Testing Analog and Mixed-Signal Circuits Using Functionally Related Excitations and Functionally Related Measurements Application Type: Utility Patent Number: 7129734 ...
URL: https://www.src.org/library/patent/p0458/
Modified: 2006-10-31 - 25KB
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- 6:
Method for Testing Analog and Mixed-Signal Circuits Using Dynamic...
- Method for Testing Analog and Mixed-Signal Circuits Using Dynamic Element Matching for Source Linearization Application Type: Utility Patent Number: 7587647 Country: United States ...
URL: https://www.src.org/library/patent/p0468/
Modified: 2009-09-08 - 23KB
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- 7:
Signal Tracing Using On-Chip Memory For In-System Post-Fabrication...
- Signal Tracing Using On-Chip Memory For In-System Post-Fabrication Debug Application Type: Utility Patent Number: 9720036 Country: United States Status: Filed on 18-Aug-2014, ...
URL: https://www.src.org/library/patent/p1495/
Modified: 2017-08-01 - 23KB
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- 8:
Signal Tracing using ON-Chip Memory for In-System Post-Fabrication...
- Signal Tracing using ON-Chip Memory for In-System Post-Fabrication Debug Application Type: Continuation Patent Number: 10732221 Country: United States Status: Filed on 26-Jun-2017, ...
URL: https://www.src.org/library/patent/p1733/
Modified: 2020-08-04 - 24KB
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- 9:
Charge-Based Frequency Measurement BIST (Patent P0557) - SRC
- Charge-Based Frequency Measurement BIST Application Type: European Patent Office Patent Number: 1214605 Status: Filed on 19-Jun-2002, Issued on 22-Mar-2006 Organization: University ...
URL: https://www.src.org/library/patent/p0557/
Modified: 2006-03-22 - 23KB
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- 10:
Charge-Based Frequency Measurement BIST (Patent P0185) - SRC
- Charge-Based Frequency Measurement BIST Application Type: Utility Patent Number: 6885700 Country: United States Status: Filed on 23-Sep-1999, Issued on 26-Apr-2005, Patent ...
URL: https://www.src.org/library/patent/p0185/
Modified: 2005-04-26 - 24KB
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- 11:
Characterization Of Radio Frequency (RF) Signals Using Wavelet...
- Characterization Of Radio Frequency (RF) Signals Using Wavelet-Based Parameter Extraction Application Type: Utility Patent Number: 7340381 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0325/
Modified: 2008-03-04 - 23KB
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- 12:
Methods for Characterizing, Generating Test Sequences for, and...
- Methods for Characterizing, Generating Test Sequences for, and Simulating Integrated Circuit Faults Using Fault Tuples and Related Systems and Computer Program Products Application ...
URL: https://www.src.org/library/patent/p0228/
Modified: 2004-12-28 - 22KB
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- 13:
Embedded IC Test Circuits and Methods (Patent P0525) - SRC
- Embedded IC Test Circuits and Methods Application Type: Utility Patent Number: 7379716 Country: United States Status: Filed on 24-Mar-2005, Issued on 27-May-2008, Patent Abandoned ...
URL: https://www.src.org/library/patent/p0525/
Modified: 2008-05-27 - 23KB
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- 14:
Power Detector of Embedded IC Test Circuits (Patent P1077) -...
- Power Detector of Embedded IC Test Circuits Application Type: Divisional Patent Number: 7925229 Country: United States Status: Filed on 25-Apr-2008, Issued on 12-Apr-2011, Patent ...
URL: https://www.src.org/library/patent/p1077/
Modified: 2011-04-12 - 23KB
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- 15:
PowerPoint Presentation
- Innovate in India OR Make in India What is relevant for companies like Texas Instruments in India? Santhosh Kumar Texas Instruments sant@ti.com Texas Instruments An Overview Our ...
URL: https://www.src.org/calendar/e005563/ti_india_santhosh.pdf
Modified: 2015-02-04 - 2.9MB
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