Embedded IC Test Circuits and Methods

    • Application Type:
      Utility
      Patent Number:
      7379716
      Country:
      United States
      Status:
      Filed on 24-Mar-2005, Issued on 27-May-2008, Patent Abandoned
      Organization:
      University of Florida
      SRC Filing ID:
      P0525

    Inventors

    • William R. Eisenstadt (Univ. of Florida)
    • Tao Zhang (Univ. of Florida)
    • Robert M. Fox (Univ. of Florida)

    Related Patents

    P1077
    Abandoned Patent
    GRC

    Power Detector of Embedded IC Test Circuits

    William R. Eisenstadt (Univ. of Florida); Robert M. Fox (Univ. of Florida); Tao Zhang (Univ. of Florida)
    Patent Abandoned
    Application Type: Divisional

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