Power Detector of Embedded IC Test Circuits

    • Application Type:
      Divisional
      Patent Number:
      7925229
      Country:
      United States
      Status:
      Filed on 25-Apr-2008, Issued on 12-Apr-2011, Patent Abandoned
      Organization:
      University of Florida
      SRC Filing ID:
      P1077

    Inventors

    • William R. Eisenstadt (Univ. of Florida)
    • Tao Zhang (Univ. of Florida)
    • Robert M. Fox (Univ. of Florida)

    Related Patents

    P0525
    Abandoned Patent
    GRC

    Embedded IC Test Circuits and Methods

    William R. Eisenstadt (Univ. of Florida); Robert M. Fox (Univ. of Florida); Tao Zhang (Univ. of Florida)
    Patent Abandoned
    Application Type: Utility

    INFORMATION

    FOR MEMBERS

    SRC VALUE

    ACADEMIA

    4819 Emperor Blvd, Suite 300 Durham, NC 27703 Voice: (919) 941-9400 Fax: (919) 941-9450

    © 2024 by Semiconductor Research Corporation ®
    Access to information on this website may be limited to member companies,
    participating agencies, and qualified researchers.

    Important Information for the SRC website. This site uses cookies to store information on your computer. By continuing to use our site, you consent to our cookies. If you are not happy with the use of these cookies, please review our Cookie Policy to learn how they can be disabled. By disabling cookies, some features of the site will not work.