Method and Apparatus For Rapidly Modeling and Simulating Intra-Die Statistical Variations in Integrated Circuits using Compressed Parameter Models

    • Application Type:
      Utility
      Patent Number:
      8290761
      Country:
      United States
      Status:
      Filed on 4-Jun-2009, Issued on 16-Oct-2012, Patent Abandoned
      Organization:
      Carnegie Mellon University
      SRC Filing ID:
      P1160

    Inventors

    • Amith Singhee (Carnegie Mellon Univ.)
    • Sonia Singhal (Carnegie Mellon Univ.)
    • Rob A. Rutenbar (Carnegie Mellon Univ.)

    Related Patents

    P1097
    Application Expired
    FCRP
    GRC

    Method and Apparatus For Rapidly Modeling and Simulating Intra-Die Statistical Variations In Integrated Circuits

    Rob A. Rutenbar (Carnegie Mellon Univ.); Sonia Singhal (Carnegie Mellon Univ.); Amith Singhee (Carnegie Mellon Univ.)
    Patent Application Expired
    Application Type: Provisional

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