Investigation of Reliability and Recovery Mechanisms in Cu/HfO2/Pt Selector Switches

  • Authors:
    Bhaswar Chakrabarti (Univ. of Chicago), Sushant S. Sonde (Univ. of Chicago), Supratik Guha (Univ. of Chicago)
    Publication ID:
    P091043
    Publication Type:
    Poster
    Received Date:
    1-Jun-2017
    Last Edit Date:
    5-Jun-2017
    Research:
    2698.001 (University of Notre Dame)

Abstract

This poster was presented at the EXCEL center Annual Review on May 31, 2017 at Notre Dame, IN.

Past Events

  Event Summary
31–1 May 2017–June 2017
NRI
NRI
EXCEL Center at Notre Dame E2CDA-NRI Liaison Team Visit
Wednesday, May 31, 2017, 8 a.m. — Thursday, June 1, 2017, noon ET
Notre Dame, IN, United States
E2CDA-NRI Liaison Team Visit to the University of Notre Dame. Team members, Center personnel, and TPG only.

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