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Patent Filings
SRC Program
GRC 374
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TxACE 25
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CD – Circuit Design 46
TT – Test & Testability 35
PAT – Patterning 31
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Advanced Devices & Technologies 17
Factory Systems 16
AMS-CSD – Analog/Mixed-Signal Ci... 15
HWS – Hardware Security 15
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ISD – Integrated System Design 12
Pat(MPS) – Patterning 10
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I3T – Innovative and Intelligent... 9
PKG – Packaging 9
DCMOS – Digital CMOS Technologie... 8
SLD – System Level Design 8
ADS – Alternative Device Structu... 7
Back End Processes 7
DesTech – Design Techniques 6
MT – Memory Technologies 6
CFM&TCM – CFM & Total Chemical M... 5
AMML-T1 – Antiferromagnetic Magn... 4
CRISP-T1 – Hardware Support for ... 4
ESH – Environment Safety and Hea... 4
NMP – Nanomanufacturing Material... 4
Packaging & Interconnect Systems 4
TechCAD – Technology CAD 4
Materials 3
PatMat – Patterning Materials 3
Physical Design 3
VER – Verification 3
CRISP-T3 – Scaling Applications ... 2
LMD – Logic and Memory Devices 2
MTMP – Metrology Tools Matls & P... 2
Processes – Processes 2
SemiSynBio – Semiconductor Synth... 2
ASCENT-T4 – Merged Logic Memory ... 1
AdvTech – Advanced Technology 1
C&S – Controls and Sensing 1
CAPSL-T4 – Architectures and Sys... 1
CM – Compact Modeling 1
ComSenTer-T1 – Systems and Algor... 1
DV – Design Verification 1
DesSyn – Design Synthesis 1
Front End Processes 1
Metrology 1
Modeling & Simulation 1
Multi-level Interconnect 1
Reliability 1
Synthesis & Verification 1
GRC Science Area
MPS – Material & Process Science... 79
CADTS – Computer Aided Design & ... 75
ICSS – Integrated Circuit & Syst... 67
NMS – Nanomanufacturing Sciences 59
NIS – Nanostructure & Integratio... 51
DES – Design Sciences 27
LIT – Lithography Sciences 27
IPS – Interconnect & Packaging S... 24
DS – Device Sciences 23
MBP – Materials & Bulk Processes... 16
MIC – Microstructure Sciences 15
PID – Process Integration & Devi... 14
INT – Interconnect Sciences 9
ES-H – Environmental Safety & He... 3
MFGPS – Manufacturing Process Sc... 2
FAC – Factory Sciences 1
1 through 30 of 472 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 3 4 5 6 7 8 9 10 next >>
1: Embedded IC Test Circuits and Methods (Patent P0525) - SRC
Embedded IC Test Circuits and Methods Application Type: Utility Patent Number: 7379716 Country: United States Status: Filed on 24-Mar-2005, Issued on 27-May-2008, Patent Abandoned ...
URL: https://www.src.org/library/patent/p0525/
Modified: 2008-05-27 - 23KB
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2: Power Detector of Embedded IC Test Circuits (Patent P1077) -...
Power Detector of Embedded IC Test Circuits Application Type: Divisional Patent Number: 7925229 Country: United States Status: Filed on 25-Apr-2008, Issued on 12-Apr-2011, Patent ...
URL: https://www.src.org/library/patent/p1077/
Modified: 2011-04-12 - 23KB
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3: Tunable Active Directional Couplers (Patent P1350) - SRC
Tunable Active Directional Couplers Application Type: Utility Patent Number: 8704575 Country: United States Status: Filed on 18-Jun-2012, Issued on 22-Apr-2014 Organization: ...
URL: https://www.src.org/library/patent/p1350/
Modified: 2014-04-22 - 23KB
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4: Embedded Phase Noise Measurement System (Patent P1158) - SRC
Embedded Phase Noise Measurement System Application Type: Utility Patent Number: 7952408 Country: United States Status: Filed on 26-Jun-2009, Issued on 31-May-2011, Patent ...
URL: https://www.src.org/library/patent/p1158/
Modified: 2011-05-31 - 21KB
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5: Broadband Active Balun (Patent P1112) - SRC
Broadband Active Balun Application Type: Utility Patent Number: 7737789 Country: United States Status: Filed on 19-Oct-2008, Issued on 15-Jun-2010, Patent Abandoned Organization: ...
URL: https://www.src.org/library/patent/p1112/
Modified: 2010-06-15 - 22KB
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6: Self-Test for Low Dropout Regulator Measurement (Patent P1947...
Self-Test for Low Dropout Regulator Measurement Application Type: Utility Country: United States Status: Filed on 26-Feb-2021, Published by Patent Office Organization: University ...
URL: https://www.src.org/library/patent/p1947/
Modified: 2021-02-26 - 23KB
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7: Oriented Crystal Nanowire Interconnects (Patent P1479) - SRC
Oriented Crystal Nanowire Interconnects Application Type: Utility Patent Number: 9117821 Country: United States Status: Filed on 11-Mar-2014, Issued on 25-Aug-2015, Patent ...
URL: https://www.src.org/library/patent/p1479/
Modified: 2015-08-25 - 23KB
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8: High Gain Integrated Antenna and Devices Therefrom (Patent P0392...
High Gain Integrated Antenna and Devices Therefrom Application Type: Utility Patent Number: 6842144 Country: United States Status: Filed on 10-Jun-2003, Issued on 11-Jan-2005, ...
URL: https://www.src.org/library/patent/p0392/
Modified: 2005-01-11 - 22KB
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9: Scanning Probe Characterization of Surfaces (Patent P0618) -...
Scanning Probe Characterization of Surfaces Application Type: Utility Patent Number: 7420106 Country: United States Status: Filed on 15-Mar-2006, Issued on 2-Sep-2008, Patent ...
URL: https://www.src.org/library/patent/p0618/
Modified: 2008-09-02 - 22KB
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10: Enhancement of Properties of Thin Film Ferroelectric Materials...
Enhancement of Properties of Thin Film Ferroelectric Materials Application Type: Utility Patent Number: 8778774 Country: United States Status: Filed on 23-Sep-2011, Issued on ...
URL: https://www.src.org/library/patent/p1303/
Modified: 2014-07-15 - 22KB
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11: Ultra Wideband Receiver (Patent P1193) - SRC
Ultra Wideband Receiver Application Type: Utility Patent Number: 8098707 Country: United States Status: Filed on 31-Jan-2007, Issued on 17-Jan-2012, Patent Abandoned Organization: ...
URL: https://www.src.org/library/patent/p1193/
Modified: 2012-01-17 - 23KB
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12: Characterization Of Radio Frequency (RF) Signals Using Wavelet...
Characterization Of Radio Frequency (RF) Signals Using Wavelet-Based Parameter Extraction Application Type: Utility Patent Number: 7340381 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0325/
Modified: 2008-03-04 - 23KB
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13: Method and System for Synthesizing Relative Timing Constraints...
Method and System for Synthesizing Relative Timing Constraints on an Integrated Circuit Design to Facilitate Timing Verification Application Type: Continuation Patent Number: ...
URL: https://www.src.org/library/patent/p1354/
Modified: 2012-11-27 - 24KB
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14: Method and System for Synthesizing Relative Timing Constraints...
Method and System for Synthesizing Relative Timing Constraints on an Integrated Circuit Design to Facilitate Timing Verification Application Type: Utility Patent Number: 8239796 ...
URL: https://www.src.org/library/patent/p1202/
Modified: 2012-08-07 - 24KB
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15: Method for Testing Analog and Mixed-Signal Circuits Using Functionally...
Method for Testing Analog and Mixed-Signal Circuits Using Functionally Related Excitations and Functionally Related Measurements Application Type: Utility Patent Number: 7129734 ...
URL: https://www.src.org/library/patent/p0458/
Modified: 2006-10-31 - 25KB
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16: Method and Apparatus for Sampling and Predicting Rare Events...
Method and Apparatus for Sampling and Predicting Rare Events in Complex Electronic Devices, Circuits and Systems Application Type: Utility Patent Number: 8155938 Country: United ...
URL: https://www.src.org/library/patent/p1078/
Modified: 2012-04-10 - 24KB
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17: Methods, Systems, and Computer Program Products for Modeling...
Methods, Systems, and Computer Program Products for Modeling inductive Effects in a circuit combing a plurality of localized models Application Type: Utility Patent Number: 6820245 ...
URL: https://www.src.org/library/patent/p0251/
Modified: 2004-11-16 - 23KB
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18: Configurable Circuits Using Phase Change Switches (Patent P0534...
Configurable Circuits Using Phase Change Switches Application Type: Utility Patent Number: 7634248 Country: United States Status: Filed on 1-Aug-2006, Issued on 15-Dec-2009, Patent ...
URL: https://www.src.org/library/patent/p0534/
Modified: 2009-12-15 - 22KB
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19: Method and System to Check Correspondence between Different Representa...
Method and System to Check Correspondence between Different Representations of a Circuit Application Type: Continuation (in part) Patent Number: 7418680 Country: United States ...
URL: https://www.src.org/library/patent/p0476/
Modified: 2008-08-26 - 22KB
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20: Systems, Methods and Computer Program Products for Creating Hierarchic...
Systems, Methods and Computer Program Products for Creating Hierarchical Equivalent Circuit Models Application Type: Utility Patent Number: 7096174 Country: United States Status: ...
URL: https://www.src.org/library/patent/p0200/
Modified: 2006-08-22 - 24KB
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21: Method and Apparatus For Rapidly Modeling and Simulating Intra...
Method and Apparatus For Rapidly Modeling and Simulating Intra-Die Statistical Variations in Integrated Circuits using Compressed Parameter Models Application Type: Utility Patent ...
URL: https://www.src.org/library/patent/p1160/
Modified: 2012-10-16 - 24KB
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22: Software-Based Self-Test and Diagnosis Using on-Chip Memory ...
Software-Based Self-Test and Diagnosis Using on-Chip Memory Application Type: Divisional Patent Number: 10788532 Country: United States Status: Filed on 30-Nov-2017, Issued on ...
URL: https://www.src.org/library/patent/p1753/
Modified: 2020-09-29 - 26KB
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23: Software-Based Self-Test and Diagnosis Using on-Chip Memory ...
Software-Based Self-Test and Diagnosis Using on-Chip Memory Application Type: Divisional Patent Number: 10845416 Country: United States Status: Filed on 30-Nov-2017, Issued on ...
URL: https://www.src.org/library/patent/p1752/
Modified: 2020-11-24 - 26KB
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24: Method for Testing Analog and Mixed-Signal Circuits Using Dynamic...
Method for Testing Analog and Mixed-Signal Circuits Using Dynamic Element Matching for Source Linearization Application Type: Utility Patent Number: 7587647 Country: United States ...
URL: https://www.src.org/library/patent/p0468/
Modified: 2009-09-08 - 23KB
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25: Self-Repairing Technique in Nano-scale SRAM to Reduce Parametric...
Self-Repairing Technique in Nano-scale SRAM to Reduce Parametric Failures Application Type: Utility Patent Number: 7508697 Country: United States Status: Filed on 9-May-2007, ...
URL: https://www.src.org/library/patent/p1008/
Modified: 2009-03-24 - 23KB
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26: System and Method to Test Integrated Circuits on a Wafer (Patent...
System and Method to Test Integrated Circuits on a Wafer Application Type: Utility Patent Number: 7325180 Country: United States Status: Filed on 26-Nov-2003, Issued on ...
URL: https://www.src.org/library/patent/p0413/
Modified: 2008-01-29 - 22KB
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27: Self Bias and Digitally Tunable Conduction Angle Circuits for...
Self Bias and Digitally Tunable Conduction Angle Circuits for a differential RF Non-linear Power Amplifier Employing Low-Voltage Transistors Application Type: Utility Patent ...
URL: https://www.src.org/library/patent/p0300/
Modified: 2007-05-22 - 22KB
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28: Method and System to Verify a Circuit Design By Verifying Consistency...
Method and System to Verify a Circuit Design By Verifying Consistency Between Two Different Language Representations of a Circuit Design Application Type: Utility Patent Number: ...
URL: https://www.src.org/library/patent/p0424/
Modified: 2007-05-29 - 22KB
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29: Formal Verification of a Logic Design Through Implicit Enumeration...
Formal Verification of a Logic Design Through Implicit Enumeration of Strongly Connected Components Application Type: Utility Patent Number: 6526551 Country: United States Status: ...
URL: https://www.src.org/library/patent/p0189/
Modified: 2003-02-25 - 22KB
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30: Methods for Characterizing, Generating Test Sequences for, and...
Methods for Characterizing, Generating Test Sequences for, and Simulating Integrated Circuit Faults Using Fault Tuples and Related Systems and Computer Program Products Application ...
URL: https://www.src.org/library/patent/p0228/
Modified: 2004-12-28 - 22KB
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1 through 30 of 472 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 3 4 5 6 7 8 9 10 next >>