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- 1:
In-situ Studies of III-V Surfaces and High-k Atomic Layer Deposition...
- In-situ Studies of III-V Surfaces and High-k Atomic Layer Deposition Date: Tuesday, Oct. 23, 2012, 4 p.m.-5:30 p.m. ET Location: via web conference, Research Triangle Park, NC, ...
URL: https://www.src.org/calendar/e004519/
Modified: 2013-04-23 - 32KB
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- 2:
 FCRP Proposers' Conference
- FCRP Proposers' Conference Welcome!! Thank you for your interest! Objectives of this event: Learning and Teaming! Hearing perspectives from DARPA and Industry regarding ...
URL: https://www.src.org/calendar/e004827/weitzman.pdf
Modified: 2012-05-16 - 58KB
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- 3:
3D IC University Research e-Workshop (Event E004357) - SRC
- 3D IC University Research e-Workshop Date: Thursday, May 5, 2011, noon-4:30 p.m. ET Location: SRC Conference Room D; via web conference, Research Triangle Park, NC, United States ...
URL: https://www.src.org/calendar/e004357/
Modified: 2011-11-05 - 43KB
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- 4:
FAQs About the Focus Center Research Program - SRC
- FAQs About the Focus Center Research Program (FCRP) FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics ...
URL: https://www.src.org/program/fcrp/about/faq/
Modified: 2010-06-26 - 29KB
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- 5:
Focus Center Research Program Overview - SRC
- Focus Centers FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now being sponsored by ...
URL: https://www.src.org/program/fcrp/centers/
Modified: 2010-06-21 - 24KB
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- 6:
Presentation Title
- PAGE 1 QUALCOMM CONFIDENTIAL AND PROPRIETARY QUALCOMM CONFIDENTIAL AND PROPRIETARY qctconnect.com 3D Through Si Stacking Technology - an IFM Perspective - RikoR May 11 PAGE 2 ...
URL: https://www.src.org/calendar/e004357/02-radojcic.pdf
Modified: 2011-05-04 - 2.4MB
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- 7:
FCRP - About - SRC
- About Focus Center Research Program FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now ...
URL: https://www.src.org/program/fcrp/about/
Modified: 2010-06-27 - 22KB
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- 8:
Semiconductor Research Corporation - SRC
- FCRP FCRP Focus Center Research Program (Legacy) Multi-Scale Systems Research Center Creation of a comprehensive and a systematic solution to the distributed multi-scale system ...
URL: https://www.src.org/program/fcrp/
Modified: 2023-10-10 - 32KB
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- 9:
Proposers' Conference for the Focus Center Research Program ...
- Proposers' Conference for the Focus Center Research Program Date: Monday, May 14, 2012, 11:30 a.m.-4 p.m. CT Location: Hyatt Regency DFW, Enterprise 7 & 8, Dallas, TX, United ...
URL: https://www.src.org/calendar/e004827/
Modified: 2012-11-14 - 49KB
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- 10:
C2S2 Organizational Structure - SRC
- C2S2 Organizational Structure FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now being ...
URL: https://www.src.org/program/fcrp/c2s2/structure/
Modified: 2010-06-21 - 20KB
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- 11:
About Materials and Devices - SRC
- About Materials and Devices Research at MSD FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research ...
URL: https://www.src.org/program/fcrp/msd/about/
Modified: 2010-06-21 - 22KB
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- 12:
FCRP Newsletter Archive - SRC
- iNFOCUS, the FCRP Monthly Newsletter FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now ...
URL: https://www.src.org/program/fcrp/newsletter/
Modified: 2012-03-28 - 24KB
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- 13:
About Circuit Design - SRC
- About Circuit Design Research at C2S2 FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now ...
URL: https://www.src.org/program/fcrp/c2s2/about/
Modified: 2010-06-21 - 25KB
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- 14:
FCRP Program Mission and Description - SRC
- FCRP Program Mission FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now being sponsored ...
URL: https://www.src.org/program/fcrp/about/mission/
Modified: 2010-06-21 - 22KB
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- 15:
Past
- PAST FCRP workshop - M Mayberry, May 2012 Source: SRC website, Feb 2011 FCRP workshop - M Mayberry, May 2012 system software systems systems structures structures materials ...
URL: https://www.src.org/calendar/e004827/mayberry.pdf
Modified: 2012-05-16 - 3.4MB
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- 16:
Carbon Electronics Workshop (Event E003973) - SRC
- Carbon Electronics Workshop Date: Tuesday, Sept. 21, 2010, 9 a.m. - Wednesday, Sept. 22, 2010, 1 p.m. ET Location: NanoFab 300, South Auditorium, CSNE, University of Albany-SUNY, ...
URL: https://www.src.org/calendar/e003973/
Modified: 2011-03-22 - 83KB
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- 17:
About Nano Materials - SRC
- About Nano Materials Research at FENA FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now ...
URL: https://www.src.org/program/fcrp/fena/about/
Modified: 2010-06-21 - 22KB
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- 18:
High-Performance Gate Oxides such as for Graphene Field-Effect...
- High-Performance Gate Oxides such as for Graphene Field-Effect Transistors or Carbon Nanotubes Application Type: Utility Patent Number: 8445893 Country: United States Status: Filed ...
URL: https://www.src.org/library/patent/p1209/
Modified: 2013-05-21 - 24KB
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- 19:
Depletion-Mode Field-Effect Transistor-Based Phototransistor...
- Depletion-Mode Field-Effect Transistor-Based Phototransistor Application Type: Continuation Patent Number: 9343608 Country: United States Status: Filed on 15-Sep-2014, Issued on ...
URL: https://www.src.org/library/patent/p1511/
Modified: 2019-05-17 - 23KB
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- 20:
Depletion-Mode Field-Effect Transistor-Based Phototransistor...
- Depletion-Mode Field-Effect Transistor-Based Phototransistor Application Type: Utility Patent Number: 8896083 Country: United States Status: Filed on 15-Mar-2013, Issued on ...
URL: https://www.src.org/library/patent/p1393/
Modified: 2014-11-25 - 23KB
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- 21:
Graphene Device Including a PVA Layer or Formed Using a PVA Layer...
- Graphene Device Including a PVA Layer or Formed Using a PVA Layer Application Type: Continuation Patent Number: 8735209 Country: United States Status: Filed on 15-Mar-2013, Issued ...
URL: https://www.src.org/library/patent/p1404/
Modified: 2014-05-27 - 24KB
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- 22:
Level-Crossing Based Circuit and Method with Offset Voltage Cancellati...
- Level-Crossing Based Circuit and Method with Offset Voltage Cancellation Application Type: Utility Patent Number: 9252658 Country: United States Status: Filed on 12-Oct-2012, ...
URL: https://www.src.org/library/patent/p1364/
Modified: 2016-02-02 - 23KB
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- 23:
Interconnected Corrugated Carbon-Based Network (Patent P1706...
- Interconnected Corrugated Carbon-Based Network Application Type: Divisional Patent Number: 10648958 Country: United States Status: Filed on 8-Feb-2017, Issued on 12-May-2020 ...
URL: https://www.src.org/library/patent/p1706/
Modified: 2020-05-12 - 24KB
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- 24:
Transistor-Based Apparatuses, Systems and Methods (Patent P1396...
- Transistor-Based Apparatuses, Systems and Methods Application Type: Utility Patent Number: 8969924 Country: United States Status: Filed on 22-Feb-2013, Issued on 3-Mar-2015, Patent ...
URL: https://www.src.org/library/patent/p1396/
Modified: 2015-03-03 - 23KB
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- 25:
All Graphene Flash Memory Device (Patent P1265) - SRC
- All Graphene Flash Memory Device Application Type: Utility Patent Number: 8772853 Country: United States Status: Filed on 12-Jul-2011, Issued on 8-Jul-2014, Patent Abandoned ...
URL: https://www.src.org/library/patent/p1265/
Modified: 2014-07-08 - 21KB
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- 26:
Method and Apparatus for Sampling and Predicting Rare Events...
- Method and Apparatus for Sampling and Predicting Rare Events in Complex Electronic Devices, Circuits and Systems Application Type: Utility Patent Number: 8155938 Country: United ...
URL: https://www.src.org/library/patent/p1078/
Modified: 2012-04-10 - 24KB
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- 27:
Method and Apparatus For Rapidly Modeling and Simulating Intra...
- Method and Apparatus For Rapidly Modeling and Simulating Intra-Die Statistical Variations in Integrated Circuits using Compressed Parameter Models Application Type: Utility Patent ...
URL: https://www.src.org/library/patent/p1160/
Modified: 2012-10-16 - 24KB
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- 28:
Apparatus and Methods for Determining Memory Device Faults (Patent...
- Apparatus and Methods for Determining Memory Device Faults Application Type: Utility Patent Number: 7548473 Country: United States Status: Filed on 14-Apr-2006, Issued on ...
URL: https://www.src.org/library/patent/p0592/
Modified: 2009-06-16 - 21KB
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- 29:
Optical Interconnects in Microelectronics Based on Azimuthally...
- Optical Interconnects in Microelectronics Based on Azimuthally Asymmetric Long-Period Fiber Grating Couplers Application Type: Utility Patent Number: 7283695 Country: United States ...
URL: https://www.src.org/library/patent/p0571/
Modified: 2007-10-16 - 21KB
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- 30:
Carbon-based Electronics Workshop (Event E004815) - SRC
- Carbon-based Electronics Workshop Date: Thursday, Sept. 20, 2012, 5 p.m. - Friday, Sept. 21, 2012, 4 p.m. ET Location: Massachusetts Institute of Technology, Building E15, ...
URL: https://www.src.org/calendar/e004815/
Modified: 2013-03-21 - 25KB
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