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| 1 through 22 of
22 similar documents, best matches first. |
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- 1:
 Past
- PAST FCRP workshop - M Mayberry, May 2012 Source: SRC website, Feb 2011 FCRP workshop - M Mayberry, May 2012 system software systems systems structures structures materials ...
URL: https://www.src.org/calendar/e004827/mayberry.pdf
Modified: 2012-05-16 - 3.4MB
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- 2:
Presentation Title
- PAGE 1 QUALCOMM CONFIDENTIAL AND PROPRIETARY QUALCOMM CONFIDENTIAL AND PROPRIETARY qctconnect.com 3D Through Si Stacking Technology - an IFM Perspective - RikoR May 11 PAGE 2 ...
URL: https://www.src.org/calendar/e004357/02-radojcic.pdf
Modified: 2011-05-04 - 2.4MB
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- 3:
Semiconductor Research Corporation - SRC
- FCRP FCRP Focus Center Research Program (Legacy) Multi-Scale Systems Research Center Creation of a comprehensive and a systematic solution to the distributed multi-scale system ...
URL: https://www.src.org/program/fcrp/
Modified: 2023-10-10 - 32KB
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- 4:
FCRP Proposers' Conference
- FCRP Proposers' Conference Welcome!! Thank you for your interest! Objectives of this event: Learning and Teaming! Hearing perspectives from DARPA and Industry regarding ...
URL: https://www.src.org/calendar/e004827/weitzman.pdf
Modified: 2012-05-16 - 58KB
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- 5:
About Circuit Design - SRC
- About Circuit Design Research at C2S2 FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now ...
URL: https://www.src.org/program/fcrp/c2s2/about/
Modified: 2010-06-21 - 25KB
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- 6:
3D IC University Research e-Workshop (Event E004357) - SRC
- 3D IC University Research e-Workshop Date: Thursday, May 5, 2011, noon-4:30 p.m. ET Location: SRC Conference Room D; via web conference, Research Triangle Park, NC, United States ...
URL: https://www.src.org/calendar/e004357/
Modified: 2011-11-05 - 43KB
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- 7:
3D IMAPS
- Tezzaron Semiconductor 05/05/2011 SRC 3D Summit Bob Patti, CTO rpatti@tezzaron.com 1 Tezzaron Semiconductor 05/05/2011 Why We Scale? 2 >180nm 90nm 65nm 130nm 45nm 28nm 22nm 16nm ...
URL: https://www.src.org/calendar/e004357/04-patti.pdf
Modified: 2011-05-04 - 4.4MB
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- 8:
About System Design at GSRC - SRC
- About System Design Research at GSRC FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now ...
URL: https://www.src.org/program/fcrp/gsrc/about/
Modified: 2010-06-21 - 22KB
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- 9:
Level-Crossing Based Circuit and Method with Offset Voltage Cancellati...
- Level-Crossing Based Circuit and Method with Offset Voltage Cancellation Application Type: Utility Patent Number: 9252658 Country: United States Status: Filed on 12-Oct-2012, ...
URL: https://www.src.org/library/patent/p1364/
Modified: 2016-02-02 - 23KB
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- 10:
PowerPoint Presentation
- RTI International High Performance Processing Systems Enabled by 3D Integration Bob Conn May 5, 2011 1 Bob Conn, RTI International, rconn@rti.org, bobconn@ieee.org RTI ...
URL: https://www.src.org/calendar/e004357/03-conn.pdf
Modified: 2011-05-04 - 1.1MB
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- 11:
State-of-the-3D Industry Future Opportunities and Challenges
- Rev 2.0 1 Building the Case for 3D 3D Vs. Scaling Technology Roadmap Technology Hurdles Psycho-political Hurdles Evolutionary vs. Revolutionary The ...
URL: https://www.src.org/calendar/e004357/01-vontrapp.pdf
Modified: 2011-05-04 - 2.3MB
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- 12:
About Complex Systems Design - SRC
- About Complex Systems Design Research at MuSyC FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics ...
URL: https://www.src.org/program/fcrp/musyc/about/
Modified: 2010-06-21 - 22KB
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- 13:
High Input/Output Density Optoelectronic Probe Card for Wafer...
- High Input/Output Density Optoelectronic Probe Card for Wafer-Level Test of Electrical and Optical Interconnect Components, Methods of Fabrication, and Methods of Use Application ...
URL: https://www.src.org/library/patent/p0361/
Modified: 2009-06-30 - 21KB
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- 14:
Systems and Methods for Distortion Measurement using
Distortion...
- Systems and Methods for Distortion Measurement using Distortion-to-Amplitude Transformations Application Type: Utility Patent Number: 8358169 Country: United States Status: Filed ...
URL: https://www.src.org/library/patent/p1637/
Modified: 2013-01-22 - 23KB
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- 15:
Power Conscious Self-Healing Transceiver Systems and Methods...
- Power Conscious Self-Healing Transceiver Systems and Methods Application Type: Utility Patent Number: 8983390 Country: United States Status: Filed on 17-May-2011, Issued on ...
URL: https://www.src.org/library/patent/p1278/
Modified: 2015-03-17 - 23KB
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- 16:
Accuracy Configurable Adders and Methods (Patent P1359) - SRC
- Accuracy Configurable Adders and Methods Application Type: Utility Patent Number: 9229686 Country: United States Status: Filed on 27-Aug-2012, Issued on 5-Jan-2016 Organization: ...
URL: https://www.src.org/library/patent/p1359/
Modified: 2016-01-05 - 24KB
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- 17:
Tunable Signal Source (Patent P1362) - SRC
- Tunable Signal Source Application Type: Utility Patent Number: 8797105 Country: United States Status: Filed on 4-Oct-2012, Issued on 5-Aug-2014, Patent Abandoned Organization: ...
URL: https://www.src.org/library/patent/p1362/
Modified: 2014-08-05 - 23KB
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- 18:
Analog and Radio Frequency (RF) System-Level Simulation Using...
- Analog and Radio Frequency (RF) System-Level Simulation Using Frequency Relaxation Application Type: Utility Patent Number: 7653524 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0574/
Modified: 2010-01-26 - 22KB
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- 19:
About Nano Materials - SRC
- About Nano Materials Research at FENA FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now ...
URL: https://www.src.org/program/fcrp/fena/about/
Modified: 2010-06-21 - 22KB
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- 20:
Method and System for Modeling Uncertainties in Integrated Circuits...
- Method and System for Modeling Uncertainties in Integrated Circuits, Systems, and Fabrication Processes Application Type: Utility Patent Number: 7920992 Country: United States ...
URL: https://www.src.org/library/patent/p0625/
Modified: 2011-04-05 - 22KB
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- 21:
System and Method for Analyzing a Nanotube Logic Circuit (Patent...
- System and Method for Analyzing a Nanotube Logic Circuit Application Type: Utility Patent Number: 8065634 Country: United States Status: Filed on 29-Sep-2008, Issued on ...
URL: https://www.src.org/library/patent/p1109/
Modified: 2011-11-22 - 24KB
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- 22:
Nanotube Logic Circuits (Patent P1101) - SRC
- Nanotube Logic Circuits Application Type: Utility Patent Number: 7911234 Country: United States Status: Filed on 29-Sep-2008, Issued on 22-Mar-2011, Patent Abandoned Organization: ...
URL: https://www.src.org/library/patent/p1101/
Modified: 2011-03-22 - 24KB
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