Viewing 181 - 195 of 553
Apparatus and Method for Shaping and Detecting a Particle Beam
David B. Kittelson (Univ. of Minnesota); Peter H. McMurry (Univ. of Minnesota); Paul Ziemann (Univ. of Minnesota)Patent Expired
Application Type: Utility
Apparatus and Method for Uniform Microwave Plasma Processing Using TE11 and TM11 Modes
Joseph Cecchi (Princeton); James E. Stevens (Princeton)Patent Expired
Application Type: Utility
Apparatus and Method for Uniformly Coating a Substrate in an Evacuable Chamber
A. Clint Clayton (RTI); Robert P. Donovan (Sandia NL); David Ensor (RTI); Ravindran Periasamy (RTI)Patent Expired
Application Type: Utility
Apparatus and Process for Producing High Density Axially Extending Plasmas
Joseph Cecchi (Princeton); James E. Stevens (Princeton)Patent Expired
Application Type: Utility
Attenuated Phase Shift Mask and a Method for Making the Mask
Bruce W. Smith (RIT)Patent Expired
Application Type: Utility
Bilayer Resist and Process for Preparing Same
Allen Gabor (Cornell); Eric Lehner (Cornell); Guoping Mao (Cornell); Christopher K. Ober (Cornell); Lizabeth Schneggenburger (Cornell)Patent Expired
Application Type: Divisional
Bilayer Resist and Process for Preparing Same
Allen Gabor (Cornell); Eric Lehner (Cornell); Guoping Mao (Cornell); Christopher K. Ober (Cornell); Lizabeth Schneggenburger (Cornell)Patent Expired
Application Type: Utility
Binary Non-Crystalline Oxide Analogs of Silicon Dioxide for Use in Gate Dielectrics and Methods of Making the Same
Gerald Lucovsky (NC State)Patent Expired
Application Type: Utility
Bipolar Transistor by Selective and Lateral Epitaxial Overgrowth
Gerold W. Neudeck (Purdue)Patent Expired
Application Type: Utility
Bipolar Transistor Having Base Region With Coupled Delta Layers
Timothy K. Carns (UCLA); Kang L. Wang (UCLA); Xinyu Zheng (UCLA)Patent Expired
Application Type: Continuation (in part)
Built-in Current Testing of Integrated Circuits
Wojciech Maly (Carnegie Mellon Univ.); Phil Nigh (Carnegie Mellon Univ.)Patent Expired
Application Type: Utility
Capacitorless Dram Device on Silicon-On-Insulator Substrate
Chenming Hu (UC/Berkeley); Clement H. Wann (UC/Berkeley)Patent Expired
Application Type: Utility
Charge Monitoring Device for Use in Semiconductor Wafer Fabrication for Unipolar Operation and Charge Monitoring
Wieslaw A. Lukaszek (Stanford)Patent Expired
Application Type: Utility
Clover Design Lateral Effect Position-Sensitive Device
Wanjun Wang (UT/Austin)Patent Expired
Application Type: Utility
Combined Ion and Molecular Beam Apparatus and Method for Depositing Materials
Nicole Herbots (MIT)Patent Expired
Application Type: Utility