Method and System for Systematic Defect Identification

    • Application Type:
      Utility
      Patent Number:
      8509517
      Country:
      United States
      Status:
      Filed on 29-Dec-2010, Issued on 13-Aug-2013
      Organization:
      Carnegie Mellon University
      SRC Filing ID:
      P1262

    Inventors

    • Ronald D. Blanton (Carnegie Mellon Univ.)
    • Wing Chiu Tam (Carnegie Mellon Univ.)

    Related Patents

    P1268
    Application Expired
    GRC

    Systematic Defect Identification and Elimination Through Layout Snippet Clustering

    Ronald D. Blanton (Carnegie Mellon Univ.); Wing Chiu Tam (Carnegie Mellon Univ.)
    Patent Application Expired
    Application Type: Provisional

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