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1 through 20 of 20 similar documents, best matches first.   
1: Characterization Of Radio Frequency (RF) Signals Using Wavelet...
Characterization Of Radio Frequency (RF) Signals Using Wavelet-Based Parameter Extraction Application Type: Utility Patent Number: 7340381 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0325/
Modified: 2008-03-04 - 23KB
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2: Charge-Based Frequency Measurement BIST (Patent P0557) - SRC
Charge-Based Frequency Measurement BIST Application Type: European Patent Office Patent Number: 1214605 Status: Filed on 19-Jun-2002, Issued on 22-Mar-2006 Organization: University ...
URL: https://www.src.org/library/patent/p0557/
Modified: 2006-03-22 - 23KB
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3: Charge-Based Frequency Measurement BIST (Patent P0185) - SRC
Charge-Based Frequency Measurement BIST Application Type: Utility Patent Number: 6885700 Country: United States Status: Filed on 23-Sep-1999, Issued on 26-Apr-2005, Patent ...
URL: https://www.src.org/library/patent/p0185/
Modified: 2005-04-26 - 24KB
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4: Receiver With Colpitts Differential Oscillator, Colpitts Quadrature...
Receiver With Colpitts Differential Oscillator, Colpitts Quadrature Oscillator, and Common-Gate Low Noise Amplifier Application Type: Divisional Patent Number: 7755442 Country: ...
URL: https://www.src.org/library/patent/p1100/
Modified: 2010-07-13 - 24KB
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5: Receiver With Colpitts Differential Oscillator, Colpitts Quadrature...
Receiver With Colpitts Differential Oscillator, Colpitts Quadrature Oscillator, And Common-Gate Low Noise Amplifier Application Type: Utility Patent Number: 7414481 Country: United ...
URL: https://www.src.org/library/patent/p0560/
Modified: 2008-08-19 - 24KB
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6: Embedded IC Test Circuits and Methods (Patent P0525) - SRC
Embedded IC Test Circuits and Methods Application Type: Utility Patent Number: 7379716 Country: United States Status: Filed on 24-Mar-2005, Issued on 27-May-2008, Patent Abandoned ...
URL: https://www.src.org/library/patent/p0525/
Modified: 2008-05-27 - 23KB
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7: Power Detector of Embedded IC Test Circuits (Patent P1077) -...
Power Detector of Embedded IC Test Circuits Application Type: Divisional Patent Number: 7925229 Country: United States Status: Filed on 25-Apr-2008, Issued on 12-Apr-2011, Patent ...
URL: https://www.src.org/library/patent/p1077/
Modified: 2011-04-12 - 23KB
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8: Signal Generator with Self-Calibration (Patent P1736) - SRC
Signal Generator with Self-Calibration Application Type: Utility Patent Number: 10116317 Country: United States Status: Filed on 15-Nov-2017, Issued on 30-Oct-2018 Organization: ...
URL: https://www.src.org/library/patent/p1736/
Modified: 2018-10-30 - 24KB
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9: Method for Testing Analog and Mixed-Signal Circuits Using Functionally...
Method for Testing Analog and Mixed-Signal Circuits Using Functionally Related Excitations and Functionally Related Measurements Application Type: Utility Patent Number: 7129734 ...
URL: https://www.src.org/library/patent/p0458/
Modified: 2006-10-31 - 25KB
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10: India Design Review (Event E005563) - SRC
India Design Review Date: Wednesday, Jan. 7, 2015, 6 p.m. - Thursday, Jan. 8, 2015, 5 p.m. Local Location: Hyatt Bangalore, 1/1, Swami Vivekananda Road, Off M.G. Road, Ulsoor, ...
URL: https://www.src.org/calendar/e005563/
Modified: 2015-02-04 - 82KB
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11: Method for Testing Analog and Mixed-Signal Circuits Using Dynamic...
Method for Testing Analog and Mixed-Signal Circuits Using Dynamic Element Matching for Source Linearization Application Type: Utility Patent Number: 7587647 Country: United States ...
URL: https://www.src.org/library/patent/p0468/
Modified: 2009-09-08 - 23KB
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12: Cost Effective DAC Linearization System (Patent P1749) - SRC
Cost Effective DAC Linearization System Application Type: Utility Patent Number: 10218371 Country: United States Status: Filed on 1-Mar-2018, Issued on 26-Feb-2019 Organization: ...
URL: https://www.src.org/library/patent/p1749/
Modified: 2019-02-26 - 28KB
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13: Method and System for Systematic Defect Identification (Patent...
Method and System for Systematic Defect Identification Application Type: Utility Patent Number: 8509517 Country: United States Status: Filed on 29-Dec-2010, Issued on 13-Aug-2013 ...
URL: https://www.src.org/library/patent/p1262/
Modified: 2013-08-13 - 23KB
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14: Methods for Characterizing, Generating Test Sequences for, and...
Methods for Characterizing, Generating Test Sequences for, and Simulating Integrated Circuit Faults Using Fault Tuples and Related Systems and Computer Program Products Application ...
URL: https://www.src.org/library/patent/p0228/
Modified: 2004-12-28 - 22KB
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15: Signal Tracing Using On-Chip Memory For In-System Post-Fabrication...
Signal Tracing Using On-Chip Memory For In-System Post-Fabrication Debug Application Type: Utility Patent Number: 9720036 Country: United States Status: Filed on 18-Aug-2014, ...
URL: https://www.src.org/library/patent/p1495/
Modified: 2017-08-01 - 23KB
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16: Signal Tracing using ON-Chip Memory for In-System Post-Fabrication...
Signal Tracing using ON-Chip Memory for In-System Post-Fabrication Debug Application Type: Continuation Patent Number: 10732221 Country: United States Status: Filed on 26-Jun-2017, ...
URL: https://www.src.org/library/patent/p1733/
Modified: 2020-08-04 - 24KB
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17: Test Pattern Generation for an Electronic Circuit Using a Transformed...
Test Pattern Generation for an Electronic Circuit Using a Transformed Circuit Description Application Type: Utility Patent Number: 5528604 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0075/
Modified: 1996-06-18 - 22KB
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18: Testing Monolithic Three Dimensional Integrated Circuits (Patent...
Testing Monolithic Three Dimensional Integrated Circuits Application Type: Utility Patent Number: 10775429 Country: United States Status: Filed on 2-Nov-2017, Issued on 15-Sep-2020 ...
URL: https://www.src.org/library/patent/p1746/
Modified: 2020-09-15 - 25KB
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19: Semiconductor Research Corporation - SRC
GRC GRC Global Research Collaboration Our motivation is to fund the most relevant and critical research for international companies, so we go where the best university talent ...
URL: https://www.src.org/program/grc/
Modified: 2023-10-10 - 33KB
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20: pdfSlide 1
Third Annual India Design Review January 7-8, 2015 William H. Joyner, Jr. CADTS William.Joyner@src.org David C. Yeh ICSS David.Yeh@src.org Restricted Distribution: Contains SRC ...
URL: https://www.src.org/...r/e005563/2015_indiawelcome_final.pdf
Modified: 2015-02-04 - 319KB
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1 through 20 of 20 similar documents, best matches first.