[x]
GRC Science Area
CADTS – Computer Aided Design & Test Sciences
|
1 through 30 of
47 similar documents, best matches first. |
|
Results by: |
Page: 1 2 |
next >>
|
- 1:
Final Report - Workshop on Failure and Uncertainty in Mixed-Signal...
- National Science Foundation Workshop on Failure and Uncertainty in Mixed-Signal Circuits and Systems Arlington, Virginia July 8-9, 2010 Principal Investigators: Ralph Cavin, ...
URL: https://www.src.org/calendar/e004025/final-report.pdf
Modified: 2011-06-01 - 914KB Find Similar Documents
- 2:
3D IC University Research e-Workshop (Event E004357) - SRC
- 3D IC University Research e-Workshop Date: Thursday, May 5, 2011, noon-4:30 p.m. ET Location: SRC Conference Room D; via web conference, Research Triangle Park, NC, United States ...
URL: https://www.src.org/calendar/e004357/
Modified: 2011-11-05 - 43KB Find Similar Documents
- 3:
SRC/NSF Design Forum - Position Statement
- Thoughts on the "Future Directions of Design Automation Research" Andreas Kuehlmann, Cadence Berkeley Labs October 24, 2006 Some of the main challenges we will face in the next ...
URL: https://www.src.org/...reas-kuehlmann-position-statement.pdf
Modified: 2011-08-02 - 69KB Find Similar Documents
- 4:
India Design Review (Event E005563) - SRC
- India Design Review Date: Wednesday, Jan. 7, 2015, 6 p.m. - Thursday, Jan. 8, 2015, 5 p.m. Local Location: Hyatt Bangalore, 1/1, Swami Vivekananda Road, Off M.G. Road, Ulsoor, ...
URL: https://www.src.org/calendar/e005563/
Modified: 2015-02-04 - 82KB Find Similar Documents
- 5:
SRC/NSF Design Forum - Professor Arvind
- Future Directions in Design Automation Arvind, CSAIL , MIT Will there be a greater or smaller variety of electronic chips a decade from now? There is a dramatic decrease in the ...
URL: https://www.src.org/...64/prof-arvind-position-statement.pdf
Modified: 2011-08-02 - 9KB Find Similar Documents
- 6:
TECHCON 2013 (Event E004683) - SRC
- TECHCON 2013 Date: Monday, Sept. 9, 2013, 8 a.m. - Tuesday, Sept. 10, 2013, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004683 E004683 image ...
URL: https://www.src.org/calendar/e004683/
Modified: 2014-03-10 - 136KB Find Similar Documents
- 7:
SRC/NSF Design Forum - Position Statement
- A Position Statement in the Forum on Future Directions for Design Automation Research Jason Cong UCLA Computer Science Department http://cadlab.cs.ucla.edu/~cong There are many ...
URL: https://www.src.org/...764/jason-cong-position-statement.pdf
Modified: 2011-08-02 - 35KB Find Similar Documents
- 8:
Semiconductor Research Corporation - SRC
- GRC GRC Global Research Collaboration Our motivation is to fund the most relevant and critical research for international companies, so we go where the best university talent ...
URL: https://www.src.org/program/grc/
Modified: 2023-10-10 - 33KB Find Similar Documents
- 9:
TECHCON 2010 Evaluation Summary - SRC
- TECHCON 2010 Evaluation Summary Overall, 134 TECHCON attendees returned evaluations; breakdown by question is: The papers/posters presented indicate research of value to the ...
URL: https://www.src.org/calendar/e003428/evaluation/
Modified: 2010-09-30 - 26KB Find Similar Documents
- 10:
Apparatus for Detecting Bugs in Logic-Based Processing Devices...
- Apparatus for Detecting Bugs in Logic-Based Processing Devices Application Type: Utility Patent Number: 10120737 Country: United States Status: Filed on 18-Feb-2016, Issued on ...
URL: https://www.src.org/library/patent/p1597/
Modified: 2018-11-06 - 23KB Find Similar Documents
- 11:
Testing Monolithic Three Dimensional Integrated Circuits (Patent...
- Testing Monolithic Three Dimensional Integrated Circuits Application Type: Utility Patent Number: 10775429 Country: United States Status: Filed on 2-Nov-2017, Issued on 15-Sep-2020 ...
URL: https://www.src.org/library/patent/p1746/
Modified: 2020-09-15 - 25KB Find Similar Documents
- 12:
Multi-Layer Integrated Circuits Having Isolation Cells for Layer...
- Multi-Layer Integrated Circuits Having Isolation Cells for Layer Testing and Related Methods Application Type: Continuation (in part) Patent Number: 10838003 Country: United States ...
URL: https://www.src.org/library/patent/p1826/
Modified: 2020-11-17 - 25KB Find Similar Documents
- 13:
Software-Based Self-Test and Diagnosis Using on-Chip Memory ...
- Software-Based Self-Test and Diagnosis Using on-Chip Memory Application Type: Divisional Patent Number: 10845416 Country: United States Status: Filed on 30-Nov-2017, Issued on ...
URL: https://www.src.org/library/patent/p1752/
Modified: 2020-11-24 - 26KB Find Similar Documents
- 14:
Non-Invasive Pre-Bond TSV TestUsing Ring Oscillators and Multiple...
- Non-Invasive Pre-Bond TSV TestUsing Ring Oscillators and Multiple Voltage Levels Application Type: Utility Patent Number: 9478720 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p1392/
Modified: 2016-11-01 - 24KB Find Similar Documents
- 15:
Method and Apparatus for Sampling and Predicting Rare Events...
- Method and Apparatus for Sampling and Predicting Rare Events in Complex Electronic Devices, Circuits and Systems Application Type: Utility Patent Number: 8155938 Country: United ...
URL: https://www.src.org/library/patent/p1078/
Modified: 2012-04-10 - 24KB Find Similar Documents
- 16:
Signal Generator with Self-Calibration (Patent P1736) - SRC
- Signal Generator with Self-Calibration Application Type: Utility Patent Number: 10116317 Country: United States Status: Filed on 15-Nov-2017, Issued on 30-Oct-2018 Organization: ...
URL: https://www.src.org/library/patent/p1736/
Modified: 2018-10-30 - 24KB Find Similar Documents
- 17:
Software-Based Self-Test and Diagnosis Using on-Chip Memory ...
- Software-Based Self-Test and Diagnosis Using on-Chip Memory Application Type: Divisional Patent Number: 10788532 Country: United States Status: Filed on 30-Nov-2017, Issued on ...
URL: https://www.src.org/library/patent/p1753/
Modified: 2020-09-29 - 26KB Find Similar Documents
- 18:
Method for Diagnosing Bridging Faults in Integrated Circuits...
- Method for Diagnosing Bridging Faults in Integrated Circuits Application Type: Utility Patent Number: 6202181 Country: United States Status: Filed on 3-Nov-1997, Issued on ...
URL: https://www.src.org/library/patent/p0199/
Modified: 2001-03-13 - 23KB Find Similar Documents
- 19:
Method and System for Synthesizing Relative Timing Constraints...
- Method and System for Synthesizing Relative Timing Constraints on an Integrated Circuit Design to Facilitate Timing Verification Application Type: Continuation Patent Number: ...
URL: https://www.src.org/library/patent/p1354/
Modified: 2012-11-27 - 24KB Find Similar Documents
- 20:
Built-in Current Testing of Integrated Circuits (Patent P0109...
- Built-in Current Testing of Integrated Circuits Application Type: Utility Patent Number: 5025344 Country: United States Status: Filed on 22-Feb-1990, Issued on 18-Jun-1991, Patent ...
URL: https://www.src.org/library/patent/p0109/
Modified: 1991-06-18 - 22KB Find Similar Documents
- 21:
Method for Correcting a Mask Design Layout (Patent P1016) - SRC
- Method for Correcting a Mask Design Layout Application Type: Continuation Patent Number: 7614032 Country: United States Status: Filed on 11-Dec-2006, Issued on 3-Nov-2009, Patent ...
URL: https://www.src.org/library/patent/p1016/
Modified: 2009-11-03 - 23KB Find Similar Documents
- 22:
Integrated Logic Circuit Including Impedance Fault Detection...
- Integrated Logic Circuit Including Impedance Fault Detection Application Type: Utility Patent Number: 5383194 Country: United States Status: Filed on 6-Nov-1992, Issued on ...
URL: https://www.src.org/library/patent/p0066/
Modified: 1995-01-17 - 21KB Find Similar Documents
- 23:
Interconnection Architecture and Method of Assessing Interconnection...
- Interconnection Architecture and Method of Assessing Interconnection Architecture Application Type: Utility Patent Number: 7622779 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p1027/
Modified: 2009-11-24 - 23KB Find Similar Documents
- 24:
Software-Based Self-Test and Diagnosis Using On-Chip Memory ...
- Software-Based Self-Test and Diagnosis Using On-Chip Memory Application Type: Utility Patent Number: 9864007 Country: United States Status: Filed on 30-Apr-2014, Issued on ...
URL: https://www.src.org/library/patent/p1457/
Modified: 2018-01-09 - 25KB Find Similar Documents
- 25:
Systems and Methods for Testing Integrated Circuits (Patent P0342...
- Systems and Methods for Testing Integrated Circuits Application Type: Utility Patent Number: 7032151 Country: United States Status: Filed on 13-Nov-2002, Issued on 18-Apr-2006, ...
URL: https://www.src.org/library/patent/p0342/
Modified: 2006-04-18 - 22KB Find Similar Documents
- 26:
Scan Test of Die Logic in 3D ICs Using TSV Probing (Patent P1368...
- Scan Test of Die Logic in 3D ICs Using TSV Probing Application Type: Utility Patent Number: 8782479 Country: United States Status: Filed on 1-Nov-2012, Issued on 15-Jul-2014, ...
URL: https://www.src.org/library/patent/p1368/
Modified: 2014-07-15 - 22KB Find Similar Documents
- 27:
System and Method to Test Integrated Circuits on a Wafer (Patent...
- System and Method to Test Integrated Circuits on a Wafer Application Type: Utility Patent Number: 7325180 Country: United States Status: Filed on 26-Nov-2003, Issued on ...
URL: https://www.src.org/library/patent/p0413/
Modified: 2008-01-29 - 22KB Find Similar Documents
- 28:
TECHCON 2011 (Event E004113) - SRC
- TECHCON 2011 Date: Monday, Sept. 12, 2011, 8 a.m. - Tuesday, Sept. 13, 2011, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004113 E004113 ...
URL: https://www.src.org/calendar/e004113/
Modified: 2012-03-13 - 97KB Find Similar Documents
- 29:
Methods, Systems, and Computer Program Products for Modeling...
- Methods, Systems, and Computer Program Products for Modeling inductive Effects in a circuit combing a plurality of localized models Application Type: Utility Patent Number: 6820245 ...
URL: https://www.src.org/library/patent/p0251/
Modified: 2004-11-16 - 23KB Find Similar Documents
- 30:
Systems and Methods for Electromagnetic Band Gap Structure Sythesis...
- Systems and Methods for Electromagnetic Band Gap Structure Sythesis Application Type: Utility Patent Number: 8060457 Country: United States Status: Filed on 13-Sep-2007, Issued on ...
URL: https://www.src.org/library/patent/p1039/
Modified: 2011-11-15 - 22KB Find Similar Documents
1 through 30 of
47 similar documents, best matches first. |
|
Results by: |
Page: 1 2 |
next >>
|
|
|