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Thrust/Theme
TT – Test & Testability
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- 1:
India Design Review (Event E005563) - SRC
- India Design Review Date: Wednesday, Jan. 7, 2015, 6 p.m. - Thursday, Jan. 8, 2015, 5 p.m. Local Location: Hyatt Bangalore, 1/1, Swami Vivekananda Road, Off M.G. Road, Ulsoor, ...
URL: https://www.src.org/calendar/e005563/
Modified: 2015-02-04 - 82KB
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- 2:
Cost Effective DAC Linearization System (Patent P1749) - SRC
- Cost Effective DAC Linearization System Application Type: Utility Patent Number: 10218371 Country: United States Status: Filed on 1-Mar-2018, Issued on 26-Feb-2019 Organization: ...
URL: https://www.src.org/library/patent/p1749/
Modified: 2019-02-26 - 28KB
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- 3:
Method and System for Systematic Defect Identification (Patent...
- Method and System for Systematic Defect Identification Application Type: Utility Patent Number: 8509517 Country: United States Status: Filed on 29-Dec-2010, Issued on 13-Aug-2013 ...
URL: https://www.src.org/library/patent/p1262/
Modified: 2013-08-13 - 23KB
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- 4:
Methods for Characterizing, Generating Test Sequences for, and...
- Methods for Characterizing, Generating Test Sequences for, and Simulating Integrated Circuit Faults Using Fault Tuples and Related Systems and Computer Program Products Application ...
URL: https://www.src.org/library/patent/p0228/
Modified: 2004-12-28 - 22KB
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- 5:
Signal Generator with Self-Calibration (Patent P1736) - SRC
- Signal Generator with Self-Calibration Application Type: Utility Patent Number: 10116317 Country: United States Status: Filed on 15-Nov-2017, Issued on 30-Oct-2018 Organization: ...
URL: https://www.src.org/library/patent/p1736/
Modified: 2018-10-30 - 24KB
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- 6:
Charge-Based Frequency Measurement BIST (Patent P0557) - SRC
- Charge-Based Frequency Measurement BIST Application Type: European Patent Office Patent Number: 1214605 Status: Filed on 19-Jun-2002, Issued on 22-Mar-2006 Organization: University ...
URL: https://www.src.org/library/patent/p0557/
Modified: 2006-03-22 - 23KB
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- 7:
Characterization Of Radio Frequency (RF) Signals Using Wavelet...
- Characterization Of Radio Frequency (RF) Signals Using Wavelet-Based Parameter Extraction Application Type: Utility Patent Number: 7340381 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0325/
Modified: 2008-03-04 - 23KB
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- 8:
Charge-Based Frequency Measurement BIST (Patent P0185) - SRC
- Charge-Based Frequency Measurement BIST Application Type: Utility Patent Number: 6885700 Country: United States Status: Filed on 23-Sep-1999, Issued on 26-Apr-2005, Patent ...
URL: https://www.src.org/library/patent/p0185/
Modified: 2005-04-26 - 24KB
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- 9:
High Speed Data Converter Testing Devices, Methods, & System...
- High Speed Data Converter Testing Devices, Methods, & System Application Type: Utility Patent Number: 7250882 Country: United States Status: Filed on 3-Mar-2006, Issued on ...
URL: https://www.src.org/library/patent/p0612/
Modified: 2007-07-31 - 22KB
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- 10:
Systems and Methods for Testing Integrated Circuits (Patent P0342...
- Systems and Methods for Testing Integrated Circuits Application Type: Utility Patent Number: 7032151 Country: United States Status: Filed on 13-Nov-2002, Issued on 18-Apr-2006, ...
URL: https://www.src.org/library/patent/p0342/
Modified: 2006-04-18 - 22KB
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- 11:
Embedded IC Test Circuits and Methods (Patent P0525) - SRC
- Embedded IC Test Circuits and Methods Application Type: Utility Patent Number: 7379716 Country: United States Status: Filed on 24-Mar-2005, Issued on 27-May-2008, Patent Abandoned ...
URL: https://www.src.org/library/patent/p0525/
Modified: 2008-05-27 - 23KB
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- 12:
Power Detector of Embedded IC Test Circuits (Patent P1077) -...
- Power Detector of Embedded IC Test Circuits Application Type: Divisional Patent Number: 7925229 Country: United States Status: Filed on 25-Apr-2008, Issued on 12-Apr-2011, Patent ...
URL: https://www.src.org/library/patent/p1077/
Modified: 2011-04-12 - 23KB
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- 13:
Method for Testing Analog and Mixed-Signal Circuits Using Functionally...
- Method for Testing Analog and Mixed-Signal Circuits Using Functionally Related Excitations and Functionally Related Measurements Application Type: Utility Patent Number: 7129734 ...
URL: https://www.src.org/library/patent/p0458/
Modified: 2006-10-31 - 25KB
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- 14:
Test Pattern Generation for an Electronic Circuit Using a Transformed...
- Test Pattern Generation for an Electronic Circuit Using a Transformed Circuit Description Application Type: Utility Patent Number: 5528604 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0075/
Modified: 1996-06-18 - 22KB
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- 15:
Receiver With Colpitts Differential Oscillator, Colpitts Quadrature...
- Receiver With Colpitts Differential Oscillator, Colpitts Quadrature Oscillator, and Common-Gate Low Noise Amplifier Application Type: Divisional Patent Number: 7755442 Country: ...
URL: https://www.src.org/library/patent/p1100/
Modified: 2010-07-13 - 24KB
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- 16:
Receiver With Colpitts Differential Oscillator, Colpitts Quadrature...
- Receiver With Colpitts Differential Oscillator, Colpitts Quadrature Oscillator, And Common-Gate Low Noise Amplifier Application Type: Utility Patent Number: 7414481 Country: United ...
URL: https://www.src.org/library/patent/p0560/
Modified: 2008-08-19 - 24KB
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- 17:
Method for Testing Analog and Mixed-Signal Circuits Using Dynamic...
- Method for Testing Analog and Mixed-Signal Circuits Using Dynamic Element Matching for Source Linearization Application Type: Utility Patent Number: 7587647 Country: United States ...
URL: https://www.src.org/library/patent/p0468/
Modified: 2009-09-08 - 23KB
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- 18:
Signal Tracing Using On-Chip Memory For In-System Post-Fabrication...
- Signal Tracing Using On-Chip Memory For In-System Post-Fabrication Debug Application Type: Utility Patent Number: 9720036 Country: United States Status: Filed on 18-Aug-2014, ...
URL: https://www.src.org/library/patent/p1495/
Modified: 2017-08-01 - 23KB
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- 19:
Signal Tracing using ON-Chip Memory for In-System Post-Fabrication...
- Signal Tracing using ON-Chip Memory for In-System Post-Fabrication Debug Application Type: Continuation Patent Number: 10732221 Country: United States Status: Filed on 26-Jun-2017, ...
URL: https://www.src.org/library/patent/p1733/
Modified: 2020-08-04 - 24KB
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- 20:
Systems and Methods for Electromagnetic Band Gap Structure Sythesis...
- Systems and Methods for Electromagnetic Band Gap Structure Sythesis Application Type: Utility Patent Number: 8060457 Country: United States Status: Filed on 13-Sep-2007, Issued on ...
URL: https://www.src.org/library/patent/p1039/
Modified: 2011-11-15 - 22KB
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- 21:
Method and System for Testing an Electric Circuit (Patent P1260...
- Method and System for Testing an Electric Circuit Application Type: Utility Patent Number: 8742777 Country: United States Status: Filed on 29-Dec-2010, Issued on 3-Jun-2014, Patent ...
URL: https://www.src.org/library/patent/p1260/
Modified: 2014-06-03 - 22KB
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- 22:
Testing Monolithic Three Dimensional Integrated Circuits (Patent...
- Testing Monolithic Three Dimensional Integrated Circuits Application Type: Utility Patent Number: 10775429 Country: United States Status: Filed on 2-Nov-2017, Issued on 15-Sep-2020 ...
URL: https://www.src.org/library/patent/p1746/
Modified: 2020-09-15 - 25KB
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- 23:
Software-Based Self-Test and Diagnosis Using on-Chip Memory ...
- Software-Based Self-Test and Diagnosis Using on-Chip Memory Application Type: Divisional Patent Number: 10788532 Country: United States Status: Filed on 30-Nov-2017, Issued on ...
URL: https://www.src.org/library/patent/p1753/
Modified: 2020-09-29 - 26KB
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- 24:
Software-Based Self-Test and Diagnosis Using on-Chip Memory ...
- Software-Based Self-Test and Diagnosis Using on-Chip Memory Application Type: Divisional Patent Number: 10845416 Country: United States Status: Filed on 30-Nov-2017, Issued on ...
URL: https://www.src.org/library/patent/p1752/
Modified: 2020-11-24 - 26KB
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- 25:
Software-Based Self-Test and Diagnosis Using On-Chip Memory ...
- Software-Based Self-Test and Diagnosis Using On-Chip Memory Application Type: Utility Patent Number: 9864007 Country: United States Status: Filed on 30-Apr-2014, Issued on ...
URL: https://www.src.org/library/patent/p1457/
Modified: 2018-01-09 - 25KB
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- 26:
Power Switch Design and Method for Reducing Leakage Power in...
- Power Switch Design and Method for Reducing Leakage Power in Low-Power Integrated Circuits Application Type: Utility Patent Number: 8373493 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p1239/
Modified: 2013-02-12 - 22KB
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- 27:
Multi-Layer Integrated Circuits Having Isolation Cells for Layer...
- Multi-Layer Integrated Circuits Having Isolation Cells for Layer Testing and Related Methods Application Type: Continuation (in part) Patent Number: 10838003 Country: United States ...
URL: https://www.src.org/library/patent/p1826/
Modified: 2020-11-17 - 25KB
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- 28:
Multi-Layer Integrated Circuits Having Isolation Cells for Layer...
- Multi-Layer Integrated Circuits Having Isolation Cells for Layer Testing and Related Methods Application Type: Utility Patent Number: 10338133 Country: United States Status: Filed ...
URL: https://www.src.org/library/patent/p1639/
Modified: 2019-07-02 - 25KB
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- 29:
Method and Architecture for Pre-bond Probing of TSVs in 3D Stacked...
- Method and Architecture for Pre-bond Probing of TSVs in 3D Stacked Integrated Circuits Application Type: Utility Patent Number: 8775108 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p1291/
Modified: 2014-07-08 - 22KB
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- 30:
Non-Invasive Pre-Bond TSV TestUsing Ring Oscillators and Multiple...
- Non-Invasive Pre-Bond TSV TestUsing Ring Oscillators and Multiple Voltage Levels Application Type: Utility Patent Number: 9478720 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p1392/
Modified: 2016-11-01 - 24KB
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