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GRC Science Area
CADTS – Computer Aided Design & Test Sciences
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| 1 through 12 of
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- 1:
 E003932 - Variability Forum - Cao
- Predictive Variability Predictive Variability Modeling Modeling Predictive Variability Predictive Variability Modeling Modeling d D i I li ti d D i I li ti and Design Implications ...
URL: https://www.src.org/calendar/e003932/e003932_s2_3_cao.pdf
Modified: 2010-06-29 - 2.6MB
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- 2:
E003932 - Variability Forum - Gupta
- NanoCAD Lab Modeling Performance Impact of Variability Puneet Gupta Dept. of EE, University of California Los Angeles (puneet@ee.ucla.edu) Work partly supported by NSF, UC ...
URL: https://www.src.org/calendar/e003932/e003932_s2_2_gupta.pdf
Modified: 2010-06-29 - 1.4MB
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- 3:
E003932 - Variability Forum - McAndrew
- Variability Modeling at the Device Level for Circuit Simulation First International Variability Characterization Workshop April 30, 2010 Freescale Semiconductor Colin McAndrew ...
URL: https://www.src.org/...dar/e003932/e003932_s1_2_mcandrew.pdf
Modified: 2010-06-29 - 1.1MB
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- 4:
E003932 - Variability Forum - Opening20100430
- The 1st International Variability Characterization Workshop 2 Organizing Committee Yao-Wen Chang National Taiwan University Costas J. Spanos Univ. of California, Berkeley William ...
URL: https://www.src.org/calendar/e003932/e003932_s0_opening.pdf
Modified: 2010-06-29 - 597KB
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- 5:
Final Report - Workshop on Failure and Uncertainty in Mixed-Signal...
- National Science Foundation Workshop on Failure and Uncertainty in Mixed-Signal Circuits and Systems Arlington, Virginia July 8-9, 2010 Principal Investigators: Ralph Cavin, ...
URL: https://www.src.org/calendar/e004025/final-report.pdf
Modified: 2011-06-01 - 914KB
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- 6:
Presentation Title
- PAGE 1 QUALCOMM CONFIDENTIAL AND PROPRIETARY QUALCOMM CONFIDENTIAL AND PROPRIETARY qctconnect.com 3D Through Si Stacking Technology - an IFM Perspective - RikoR May 11 PAGE 2 ...
URL: https://www.src.org/calendar/e004357/02-radojcic.pdf
Modified: 2011-05-04 - 2.4MB
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- 7:
E003932 - Variability Forum - Spanos
- 1 University of California . Berkeley . EECS . C. J. Spanos . 4/30/2010 Statistical Description of Process Variability First International Variability Characterization Workshop ...
URL: https://www.src.org/calendar/e003932/e003932_s2_1_spanos.pdf
Modified: 2010-06-29 - 2.8MB
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- 8:
E003932 - Variability Forum - Nowka
- Test Structures for Variability Characterization Kevin Nowka IBM Research - Austin nowka@us.ibm.com IBM Research Worldwide Watson Almaden Zurich Beijing Haifa Austin Tokyo Delhi ...
URL: https://www.src.org/calendar/e003932/e003932_s1_3_nowka.pdf
Modified: 2010-06-29 - 1.4MB
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- 9:
E003932 - Variability Forum - Torres
- Variability, Friend or Foe?: An EDA Foe?: An EDA perspective J. Andres Torres LFD Product Lead Engineer Calibre Design to Silicon Division Calibre Design to Silicon Division April ...
URL: https://www.src.org/calendar/e003932/e003932_s3_2_torres.pdf
Modified: 2010-06-29 - 387KB
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- 10:
TECHCON 2013 (Event E004683) - SRC
- TECHCON 2013 Date: Monday, Sept. 9, 2013, 8 a.m. - Tuesday, Sept. 10, 2013, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004683 E004683 image ...
URL: https://www.src.org/calendar/e004683/
Modified: 2014-03-10 - 136KB
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- 11:
Vertically Integrated Test/Calibration and Reliability Enhancement...
- Vertically Integrated Test/Calibration and Reliability Test/Calibration and Reliability Enhancement for Systems with RF/Analog Content RF/Analog Content Sule Ozev Sule.ozev@asu.edu ...
URL: https://www.src.org/calendar/e004025/ozev.pdf
Modified: 2010-07-19 - 54KB
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- 12:
E003932 - Variability Forum - Chuang_Su
- C. T. Chuang and P. Su, 04/2010 Variability and Design of SRAM in Scaled and Emerging Technologies Ching-Te Chuang and Pin Su Department of Electronics Engineering and Institute of ...
URL: https://www.src.org/...ar/e003932/e003932_s3_1_chuang_su.pdf
Modified: 2010-06-29 - 1.8MB
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