Questions?
[x] GRC Science Area
CADTS – Computer Aided Design & Test Sciences

Content Type
Patent Filings 39
Events 15
Other 1

SRC Program
GRC 45
SRC 10
FCRP 3
3D EC 1

Year
2015 2
2013 2
2012 3
2011 4
2010 4

Center
C2S2 8
TxACE 8
FENA 6
GSRC 6
IFC 6
MSD 6
MuSyC 5
EBSM 4
NPT 3
C-FAR 2
CNFD 2
FAME 2
INDEX 2
LEAST 2
SONIC 2
SWAN 2
TerraSwarm 2
ACE4S 1
CAIST 1
CDADIC 1
CEMPI 1
CHIRP 1
IPC 1
NCRC 1

Thrust/Theme
TT – Test & Testability 19
LPD – Logic & Physical Design 17
CADT – Computer-Aided Design and... 9
VER – Verification 6
Physical Design 5
AMS-CSD – Analog/Mixed-Signal Ci... 3
CD – Circuit Design 3
HWS – Hardware Security 3
ISD – Integrated System Design 3
SLD – System Level Design 3
DesTech – Design Techniques 2
I3T – Innovative and Intelligent... 2
Synthesis & Verification 2
ADS – Alternative Device Structu... 1
AIHW – Artificial Intelligence H... 1
AMS – Analog and Mixed-Signal De... 1
AdvTech – Advanced Technology 1
Advanced Bipolar SOI-MOS Transis... 1
Advanced Devices 1
Advanced Devices & Technologies 1
Advanced Technology Option 1
Analysis Design & Simulation 1
BEP – Back End Processes 1
Back End Processes 1
C&S – Controls and Sensing 1
CFM&TCM – CFM & Total Chemical M... 1
CM – Compact Modeling 1
CSR – Cross-Disciplinary Semicon... 1
Contamination Control 1
Cost Reduction 1
DCMOS – Digital CMOS Technologie... 1
DE – Design Environment 1
DSMS – Device Sciences Modeling ... 1
DV – Design Verification 1
Defect Reduction 1
Deposition 1
DesSyn – Design Synthesis 1
Doping Technologies 1
EP3C – Efficiency and Performanc... 1
ESH – Environment Safety and Hea... 1
Equip Automation & Process Contr... 1
Equip – Equipment 1
Equip. Auto. and Process Control 1
FACSYS – Factory Systems 1
FAM – Factory Automation & Manag... 1
FEOL – FEOL Processes 1
FacOps – Factory Operations 1
Factory Systems 1
Front End Processes 1
Heat Signal & Power Distribution 1
Heat Signal Power 1
Interconnect Architecture 1
LMD – Logic and Memory Devices 1
Lithography 1
Logic Design 1
Logistics & Modeling/Simulation 1
MT – Memory Technologies 1
MTMP – Metrology Tools Matls & P... 1
Masks 1
Materials 1
Materials & Measurements 1
Metrology 1
Modeling & Simulation 1
Modeling & TCAD 1
Multi-level Interconnect 1
NCR – Non-Classical CMOS Researc... 1
NEM – Nanoengineered Materials 1
NMP – Nanomanufacturing Material... 1
PAT – Patterning 1
PKG – Packaging 1
PMM – Packaging Materials and Me... 1
PMS – Packaging Modeling and Sim... 1
PS/E – Process Simplification/En... 1
Package & Electrical Design 1
Package Reliability 1
Packaging & Interconnect Systems 1
Packaging Materials Interfaces 1
Pat(MPS) – Patterning 1
PatMat – Patterning Materials 1
PatSys – Patterning Systems 1
PhyDes – Physical Design 1
Plasma Etch 1
Process Architecture 1
Processes – Processes 1
Quality & Reliability 1
Rapid Yield Learning 1
Reliability 1
Resist 1
SemiSynBio – Semiconductor Synth... 1
Semiconductor Modeling & Simulat... 1
Signal/Power Management 1
Substrates 1
TCAD-MBPS 1
TM – Thermal Management 1
TechCAD – Technology CAD 1

1 through 30 of 55 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 next >>
1: Characterization Of Radio Frequency (RF) Signals Using Wavelet...
Characterization Of Radio Frequency (RF) Signals Using Wavelet-Based Parameter Extraction Application Type: Utility Patent Number: 7340381 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0325/
Modified: 2008-03-04 - 23KB
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2: pdfFinal Report - Workshop on Failure and Uncertainty in Mixed-Signal...
National Science Foundation Workshop on Failure and Uncertainty in Mixed-Signal Circuits and Systems Arlington, Virginia July 8-9, 2010 Principal Investigators: Ralph Cavin, ...
URL: https://www.src.org/calendar/e004025/final-report.pdf
Modified: 2011-06-01 - 914KB
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3: Charge-Based Frequency Measurement BIST (Patent P0557) - SRC
Charge-Based Frequency Measurement BIST Application Type: European Patent Office Patent Number: 1214605 Status: Filed on 19-Jun-2002, Issued on 22-Mar-2006 Organization: University ...
URL: https://www.src.org/library/patent/p0557/
Modified: 2006-03-22 - 23KB
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4: Charge-Based Frequency Measurement BIST (Patent P0185) - SRC
Charge-Based Frequency Measurement BIST Application Type: Utility Patent Number: 6885700 Country: United States Status: Filed on 23-Sep-1999, Issued on 26-Apr-2005, Patent ...
URL: https://www.src.org/library/patent/p0185/
Modified: 2005-04-26 - 24KB
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5: Receiver With Colpitts Differential Oscillator, Colpitts Quadrature...
Receiver With Colpitts Differential Oscillator, Colpitts Quadrature Oscillator, and Common-Gate Low Noise Amplifier Application Type: Divisional Patent Number: 7755442 Country: ...
URL: https://www.src.org/library/patent/p1100/
Modified: 2010-07-13 - 24KB
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6: Receiver With Colpitts Differential Oscillator, Colpitts Quadrature...
Receiver With Colpitts Differential Oscillator, Colpitts Quadrature Oscillator, And Common-Gate Low Noise Amplifier Application Type: Utility Patent Number: 7414481 Country: United ...
URL: https://www.src.org/library/patent/p0560/
Modified: 2008-08-19 - 24KB
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7: Cell-Level Signal Electromigration (Patent P1459) - SRC
Cell-Level Signal Electromigration Application Type: Utility Patent Number: 9665680 Country: United States Status: Filed on 30-May-2014, Issued on 30-May-2017 Organization: ...
URL: https://www.src.org/library/patent/p1459/
Modified: 2017-05-30 - 22KB
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8: Embedded IC Test Circuits and Methods (Patent P0525) - SRC
Embedded IC Test Circuits and Methods Application Type: Utility Patent Number: 7379716 Country: United States Status: Filed on 24-Mar-2005, Issued on 27-May-2008, Patent Abandoned ...
URL: https://www.src.org/library/patent/p0525/
Modified: 2008-05-27 - 23KB
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9: Power Detector of Embedded IC Test Circuits (Patent P1077) -...
Power Detector of Embedded IC Test Circuits Application Type: Divisional Patent Number: 7925229 Country: United States Status: Filed on 25-Apr-2008, Issued on 12-Apr-2011, Patent ...
URL: https://www.src.org/library/patent/p1077/
Modified: 2011-04-12 - 23KB
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10: Signal Generator with Self-Calibration (Patent P1736) - SRC
Signal Generator with Self-Calibration Application Type: Utility Patent Number: 10116317 Country: United States Status: Filed on 15-Nov-2017, Issued on 30-Oct-2018 Organization: ...
URL: https://www.src.org/library/patent/p1736/
Modified: 2018-10-30 - 24KB
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11: Method for Testing Analog and Mixed-Signal Circuits Using Functionally...
Method for Testing Analog and Mixed-Signal Circuits Using Functionally Related Excitations and Functionally Related Measurements Application Type: Utility Patent Number: 7129734 ...
URL: https://www.src.org/library/patent/p0458/
Modified: 2006-10-31 - 25KB
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12: India Design Review (Event E005563) - SRC
India Design Review Date: Wednesday, Jan. 7, 2015, 6 p.m. - Thursday, Jan. 8, 2015, 5 p.m. Local Location: Hyatt Bangalore, 1/1, Swami Vivekananda Road, Off M.G. Road, Ulsoor, ...
URL: https://www.src.org/calendar/e005563/
Modified: 2015-02-04 - 82KB
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13: Method for Testing Analog and Mixed-Signal Circuits Using Dynamic...
Method for Testing Analog and Mixed-Signal Circuits Using Dynamic Element Matching for Source Linearization Application Type: Utility Patent Number: 7587647 Country: United States ...
URL: https://www.src.org/library/patent/p0468/
Modified: 2009-09-08 - 23KB
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14: TECHCON 2011 (Event E004113) - SRC
TECHCON 2011 Date: Monday, Sept. 12, 2011, 8 a.m. - Tuesday, Sept. 13, 2011, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004113 E004113 ...
URL: https://www.src.org/calendar/e004113/
Modified: 2012-03-13 - 97KB
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15: TECHCON 2013 (Event E004683) - SRC
TECHCON 2013 Date: Monday, Sept. 9, 2013, 8 a.m. - Tuesday, Sept. 10, 2013, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004683 E004683 image ...
URL: https://www.src.org/calendar/e004683/
Modified: 2014-03-10 - 136KB
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16: 3D IC University Research e-Workshop (Event E004357) - SRC
3D IC University Research e-Workshop Date: Thursday, May 5, 2011, noon-4:30 p.m. ET Location: SRC Conference Room D; via web conference, Research Triangle Park, NC, United States ...
URL: https://www.src.org/calendar/e004357/
Modified: 2011-11-05 - 43KB
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17: Quantifier Elimination by Dependency Sequents (Patent P1309)...
Quantifier Elimination by Dependency Sequents Application Type: Utility Patent Number: 8438513 Country: United States Status: Filed on 30-Dec-2011, Issued on 7-May-2013, Patent ...
URL: https://www.src.org/library/patent/p1309/
Modified: 2013-05-07 - 22KB
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18: Cost Effective DAC Linearization System (Patent P1749) - SRC
Cost Effective DAC Linearization System Application Type: Utility Patent Number: 10218371 Country: United States Status: Filed on 1-Mar-2018, Issued on 26-Feb-2019 Organization: ...
URL: https://www.src.org/library/patent/p1749/
Modified: 2019-02-26 - 28KB
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19: Method and System for Systematic Defect Identification (Patent...
Method and System for Systematic Defect Identification Application Type: Utility Patent Number: 8509517 Country: United States Status: Filed on 29-Dec-2010, Issued on 13-Aug-2013 ...
URL: https://www.src.org/library/patent/p1262/
Modified: 2013-08-13 - 23KB
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20: Built-in Current Testing of Integrated Circuits (Patent P0109...
Built-in Current Testing of Integrated Circuits Application Type: Utility Patent Number: 5025344 Country: United States Status: Filed on 22-Feb-1990, Issued on 18-Jun-1991, Patent ...
URL: https://www.src.org/library/patent/p0109/
Modified: 1991-06-18 - 22KB
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21: Asynchronous Finite State Machines (Patent P1610) - SRC
Asynchronous Finite State Machines Application Type: Utility Patent Number: 10310994 Country: United States Status: Filed on 28-Feb-2017, Issued on 4-Jun-2019 Organization: ...
URL: https://www.src.org/library/patent/p1610/
Modified: 2019-06-04 - 22KB
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22: Systems, Methods and Computer Program Products for Creating Hierarchic...
Systems, Methods and Computer Program Products for Creating Hierarchical Equivalent Circuit Models Application Type: Utility Patent Number: 7096174 Country: United States Status: ...
URL: https://www.src.org/library/patent/p0200/
Modified: 2006-08-22 - 24KB
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23: Clock Gating with an Asynchronous Wrapper Cell (Patent P1440...
Clock Gating with an Asynchronous Wrapper Cell Application Type: Utility Patent Number: 9753486 Country: United States Status: Filed on 15-Jun-2015, Issued on 5-Sep-2017 ...
URL: https://www.src.org/library/patent/p1440/
Modified: 2017-09-05 - 22KB
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24: Method and Apparatus for Sampling and Predicting Rare Events...
Method and Apparatus for Sampling and Predicting Rare Events in Complex Electronic Devices, Circuits and Systems Application Type: Utility Patent Number: 8155938 Country: United ...
URL: https://www.src.org/library/patent/p1078/
Modified: 2012-04-10 - 24KB
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25: Configurable Circuits Using Phase Change Switches (Patent P0534...
Configurable Circuits Using Phase Change Switches Application Type: Utility Patent Number: 7634248 Country: United States Status: Filed on 1-Aug-2006, Issued on 15-Dec-2009, Patent ...
URL: https://www.src.org/library/patent/p0534/
Modified: 2009-12-15 - 22KB
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26: Method and System to Check Correspondence between Different Representa...
Method and System to Check Correspondence between Different Representations of a Circuit Application Type: Continuation (in part) Patent Number: 7418680 Country: United States ...
URL: https://www.src.org/library/patent/p0476/
Modified: 2008-08-26 - 22KB
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27: System and Method to Test Integrated Circuits on a Wafer (Patent...
System and Method to Test Integrated Circuits on a Wafer Application Type: Utility Patent Number: 7325180 Country: United States Status: Filed on 26-Nov-2003, Issued on ...
URL: https://www.src.org/library/patent/p0413/
Modified: 2008-01-29 - 22KB
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28: Method and Apparatus For Rapidly Modeling and Simulating Intra...
Method and Apparatus For Rapidly Modeling and Simulating Intra-Die Statistical Variations in Integrated Circuits using Compressed Parameter Models Application Type: Utility Patent ...
URL: https://www.src.org/library/patent/p1160/
Modified: 2012-10-16 - 24KB
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29: Methods, Systems, and Computer Program Products for Modeling...
Methods, Systems, and Computer Program Products for Modeling inductive Effects in a circuit combing a plurality of localized models Application Type: Utility Patent Number: 6820245 ...
URL: https://www.src.org/library/patent/p0251/
Modified: 2004-11-16 - 23KB
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30: Wire Width Planning and Performance Optimization for VLSI Interconnect...
Wire Width Planning and Performance Optimization for VLSI Interconnects Application Type: Utility Patent Number: 6408427 Country: United States Status: Filed on 22-Feb-2000, Issued ...
URL: https://www.src.org/library/patent/p0001/
Modified: 2002-06-18 - 29KB
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1 through 30 of 55 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 next >>