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[x] GRC Science Area
CADTS – Computer Aided Design & Test Sciences

Content Type
Patent Filings 65
Events 32
Other 1

SRC Program
GRC 85
SRC 13
FCRP 6
3D EC 4

Year
2015 2
2013 2
2012 1
2011 19
2010 8

Center
C2S2 8
FENA 6
GSRC 6
IFC 6
MSD 6
TxACE 5
C-FAR 3
CNFD 3
FAME 3
INDEX 3
LEAST 3
MuSyC 3
SONIC 3
SWAN 3
TerraSwarm 3
EBSM 2
ACE4S 1
CAIST 1
CDADIC 1
CEMPI 1
CHIRP 1
IPC 1
NCRC 1
NPT 1

Thrust/Theme
TT – Test & Testability 33
LPD – Logic & Physical Design 18
CADT – Computer-Aided Design and... 11
VER – Verification 8
DesTech – Design Techniques 6
AMS-CSD – Analog/Mixed-Signal Ci... 3
CD – Circuit Design 3
HWS – Hardware Security 3
ISD – Integrated System Design 3
Physical Design 3
SLD – System Level Design 3
DV – Design Verification 2
Synthesis & Verification 2
TechCAD – Technology CAD 2
ADS – Alternative Device Structu... 1
AIHW – Artificial Intelligence H... 1
AMS – Analog and Mixed-Signal De... 1
AdvTech – Advanced Technology 1
Advanced Bipolar SOI-MOS Transis... 1
Advanced Devices 1
Advanced Devices & Technologies 1
Advanced Technology Option 1
Analysis Design & Simulation 1
BEP – Back End Processes 1
Back End Processes 1
C&S – Controls and Sensing 1
CFM&TCM – CFM & Total Chemical M... 1
CM – Compact Modeling 1
CSR – Cross-Disciplinary Semicon... 1
Contamination Control 1
Cost Reduction 1
DCMOS – Digital CMOS Technologie... 1
DE – Design Environment 1
DSMS – Device Sciences Modeling ... 1
Defect Reduction 1
Deposition 1
DesSyn – Design Synthesis 1
Doping Technologies 1
EP3C – Efficiency and Performanc... 1
ESH – Environment Safety and Hea... 1
Equip Automation & Process Contr... 1
Equip – Equipment 1
Equip. Auto. and Process Control 1
FACSYS – Factory Systems 1
FAM – Factory Automation & Manag... 1
FEOL – FEOL Processes 1
FacOps – Factory Operations 1
Factory Systems 1
Front End Processes 1
Heat Signal & Power Distribution 1
Heat Signal Power 1
I3T – Innovative and Intelligent... 1
Interconnect Architecture 1
LMD – Logic and Memory Devices 1
Lithography 1
Logic Design 1
Logistics & Modeling/Simulation 1
MT – Memory Technologies 1
MTMP – Metrology Tools Matls & P... 1
Masks 1
Materials 1
Materials & Measurements 1
Metrology 1
Modeling & Simulation 1
Modeling & TCAD 1
Multi-level Interconnect 1
NCR – Non-Classical CMOS Researc... 1
NEM – Nanoengineered Materials 1
NMP – Nanomanufacturing Material... 1
PAT – Patterning 1
PKG – Packaging 1
PMM – Packaging Materials and Me... 1
PMS – Packaging Modeling and Sim... 1
PS/E – Process Simplification/En... 1
Package & Electrical Design 1
Package Reliability 1
Packaging & Interconnect Systems 1
Packaging Materials Interfaces 1
Pat(MPS) – Patterning 1
PatMat – Patterning Materials 1
PatSys – Patterning Systems 1
PhyDes – Physical Design 1
Plasma Etch 1
Process Architecture 1
Processes – Processes 1
Quality & Reliability 1
Rapid Yield Learning 1
Reliability 1
Resist 1
SemiSynBio – Semiconductor Synth... 1
Semiconductor Modeling & Simulat... 1
Signal/Power Management 1
Substrates 1
TCAD-MBPS 1
TM – Thermal Management 1

1 through 30 of 98 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 3 4 next >>
1: Systems and Methods for Testing Integrated Circuits (Patent P0342...
Systems and Methods for Testing Integrated Circuits Application Type: Utility Patent Number: 7032151 Country: United States Status: Filed on 13-Nov-2002, Issued on 18-Apr-2006, ...
URL: https://www.src.org/library/patent/p0342/
Modified: 2006-04-18 - 22KB
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2: pdfFinal Report - Workshop on Failure and Uncertainty in Mixed-Signal...
National Science Foundation Workshop on Failure and Uncertainty in Mixed-Signal Circuits and Systems Arlington, Virginia July 8-9, 2010 Principal Investigators: Ralph Cavin, ...
URL: https://www.src.org/calendar/e004025/final-report.pdf
Modified: 2011-06-01 - 914KB
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3: High Speed Data Converter Testing Devices, Methods, & System...
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URL: https://www.src.org/library/patent/p0612/
Modified: 2007-07-31 - 22KB
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4: Systems and Methods for Electromagnetic Band Gap Structure Sythesis...
Systems and Methods for Electromagnetic Band Gap Structure Sythesis Application Type: Utility Patent Number: 8060457 Country: United States Status: Filed on 13-Sep-2007, Issued on ...
URL: https://www.src.org/library/patent/p1039/
Modified: 2011-11-15 - 22KB
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5: India Design Review (Event E005563) - SRC
India Design Review Date: Wednesday, Jan. 7, 2015, 6 p.m. - Thursday, Jan. 8, 2015, 5 p.m. Local Location: Hyatt Bangalore, 1/1, Swami Vivekananda Road, Off M.G. Road, Ulsoor, ...
URL: https://www.src.org/calendar/e005563/
Modified: 2015-02-04 - 82KB
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6: Methods for Characterizing, Generating Test Sequences for, and...
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URL: https://www.src.org/library/patent/p0228/
Modified: 2004-12-28 - 22KB
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7: 3D IC University Research e-Workshop (Event E004357) - SRC
3D IC University Research e-Workshop Date: Thursday, May 5, 2011, noon-4:30 p.m. ET Location: SRC Conference Room D; via web conference, Research Triangle Park, NC, United States ...
URL: https://www.src.org/calendar/e004357/
Modified: 2011-11-05 - 43KB
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8: TECHCON 2012 (Event E004114) - SRC
TECHCON 2012 Date: Monday, Sept. 10, 2012, 8 a.m. - Tuesday, Sept. 11, 2012, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004114 E004114 ...
URL: https://www.src.org/calendar/e004114/
Modified: 2013-03-11 - 98KB
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9: System and Method for Testing a Logic-Based Processing Device...
System and Method for Testing a Logic-Based Processing Device Application Type: Utility Patent Number: 9928150 Country: United States Status: Filed on 30-Jun-2014, Issued on ...
URL: https://www.src.org/library/patent/p1458/
Modified: 2018-03-27 - 22KB
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10: Method and System for Testing an Electric Circuit (Patent P1260...
Method and System for Testing an Electric Circuit Application Type: Utility Patent Number: 8742777 Country: United States Status: Filed on 29-Dec-2010, Issued on 3-Jun-2014, Patent ...
URL: https://www.src.org/library/patent/p1260/
Modified: 2014-06-03 - 22KB
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11: System and Method to Test Integrated Circuits on a Wafer (Patent...
System and Method to Test Integrated Circuits on a Wafer Application Type: Utility Patent Number: 7325180 Country: United States Status: Filed on 26-Nov-2003, Issued on ...
URL: https://www.src.org/library/patent/p0413/
Modified: 2008-01-29 - 22KB
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12: Multi-Layer Integrated Circuits Having Isolation Cells for Layer...
Multi-Layer Integrated Circuits Having Isolation Cells for Layer Testing and Related Methods Application Type: Continuation (in part) Patent Number: 10838003 Country: United States ...
URL: https://www.src.org/library/patent/p1826/
Modified: 2020-11-17 - 25KB
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13: Multi-Layer Integrated Circuits Having Isolation Cells for Layer...
Multi-Layer Integrated Circuits Having Isolation Cells for Layer Testing and Related Methods Application Type: Utility Patent Number: 10338133 Country: United States Status: Filed ...
URL: https://www.src.org/library/patent/p1639/
Modified: 2019-07-02 - 25KB
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14: Integrated Circuit Having Clock-Line Control and Method for Testing...
Integrated Circuit Having Clock-Line Control and Method for Testing Same Application Type: Utility Patent Number: 5519713 Country: United States Status: Filed on 2-Dec-1993, Issued ...
URL: https://www.src.org/library/patent/p0022/
Modified: 1996-05-21 - 21KB
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15: Method and System for Synthesizing Relative Timing Constraints...
Method and System for Synthesizing Relative Timing Constraints on an Integrated Circuit Design to Facilitate Timing Verification Application Type: Continuation Patent Number: ...
URL: https://www.src.org/library/patent/p1354/
Modified: 2012-11-27 - 24KB
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16: Method and System for Synthesizing Relative Timing Constraints...
Method and System for Synthesizing Relative Timing Constraints on an Integrated Circuit Design to Facilitate Timing Verification Application Type: Utility Patent Number: 8239796 ...
URL: https://www.src.org/library/patent/p1202/
Modified: 2012-08-07 - 24KB
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17: Method and System for Performing Global Routing on an Integrated...
Method and System for Performing Global Routing on an Integrated Circuit Design Application Type: Utility Patent Number: 7661085 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p1032/
Modified: 2010-02-09 - 22KB
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18: Method for Testing Analog and Mixed-Signal Circuits Using Functionally...
Method for Testing Analog and Mixed-Signal Circuits Using Functionally Related Excitations and Functionally Related Measurements Application Type: Utility Patent Number: 7129734 ...
URL: https://www.src.org/library/patent/p0458/
Modified: 2006-10-31 - 25KB
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19: Method for Testing Analog and Mixed-Signal Circuits Using Dynamic...
Method for Testing Analog and Mixed-Signal Circuits Using Dynamic Element Matching for Source Linearization Application Type: Utility Patent Number: 7587647 Country: United States ...
URL: https://www.src.org/library/patent/p0468/
Modified: 2009-09-08 - 23KB
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20: Method and Apparatus For Rapidly Modeling and Simulating Intra...
Method and Apparatus For Rapidly Modeling and Simulating Intra-Die Statistical Variations in Integrated Circuits using Compressed Parameter Models Application Type: Utility Patent ...
URL: https://www.src.org/library/patent/p1160/
Modified: 2012-10-16 - 24KB
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21: TECHCON 2010 Best in Session Awards - SRC
TECHCON 2010 Best in Session Awards Seventeen students received Best in Session Awards at TECHCON 2010, presented by Dr. Michael Mayberry, Intel, SRC Board of Directors Member ...
URL: https://www.src.org/calendar/e003428/best-in-session/
Modified: 2010-09-29 - 26KB
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22: TECHCON 2013 (Event E004683) - SRC
TECHCON 2013 Date: Monday, Sept. 9, 2013, 8 a.m. - Tuesday, Sept. 10, 2013, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004683 E004683 image ...
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Modified: 2014-03-10 - 136KB
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23: Cost Effective DAC Linearization System (Patent P1749) - SRC
Cost Effective DAC Linearization System Application Type: Utility Patent Number: 10218371 Country: United States Status: Filed on 1-Mar-2018, Issued on 26-Feb-2019 Organization: ...
URL: https://www.src.org/library/patent/p1749/
Modified: 2019-02-26 - 28KB
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24: TECHCON 2011 (Event E004113) - SRC
TECHCON 2011 Date: Monday, Sept. 12, 2011, 8 a.m. - Tuesday, Sept. 13, 2011, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004113 E004113 ...
URL: https://www.src.org/calendar/e004113/
Modified: 2012-03-13 - 97KB
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25: Systems, Methods and Computer Program Products for Creating Hierarchic...
Systems, Methods and Computer Program Products for Creating Hierarchical Equivalent Circuit Models Application Type: Utility Patent Number: 7096174 Country: United States Status: ...
URL: https://www.src.org/library/patent/p0200/
Modified: 2006-08-22 - 24KB
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26: Testing Monolithic Three Dimensional Integrated Circuits (Patent...
Testing Monolithic Three Dimensional Integrated Circuits Application Type: Utility Patent Number: 10775429 Country: United States Status: Filed on 2-Nov-2017, Issued on 15-Sep-2020 ...
URL: https://www.src.org/library/patent/p1746/
Modified: 2020-09-15 - 25KB
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27: Method and System for Systematic Defect Identification (Patent...
Method and System for Systematic Defect Identification Application Type: Utility Patent Number: 8509517 Country: United States Status: Filed on 29-Dec-2010, Issued on 13-Aug-2013 ...
URL: https://www.src.org/library/patent/p1262/
Modified: 2013-08-13 - 23KB
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28: Methods, Systems, and Computer Program Products for Modeling...
Methods, Systems, and Computer Program Products for Modeling inductive Effects in a circuit combing a plurality of localized models Application Type: Utility Patent Number: 6820245 ...
URL: https://www.src.org/library/patent/p0251/
Modified: 2004-11-16 - 23KB
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29: Method and System for Performing Optical Proximity Correction...
Method and System for Performing Optical Proximity Correction with Process Variations Considerations Application Type: Utility Patent Number: 7711504 Country: United States Status: ...
URL: https://www.src.org/library/patent/p1031/
Modified: 2010-05-04 - 23KB
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30: Method and System to Check Correspondence between Different Representa...
Method and System to Check Correspondence between Different Representations of a Circuit Application Type: Continuation (in part) Patent Number: 7418680 Country: United States ...
URL: https://www.src.org/library/patent/p0476/
Modified: 2008-08-26 - 22KB
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1 through 30 of 98 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 3 4 next >>