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1 through 30 of 191 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 3 4 5 6 7 next >>
1: Lanthanum Oxide-Based Gate Dielectrics for Integrated Circuit...
Lanthanum Oxide-Based Gate Dielectrics for Integrated Circuit Field Effect Transistors and Methods of Fabricating Same Application Type: Utility Patent Number: 6531354 Country: ...
URL: https://www.src.org/library/patent/p0194/
Modified: 2003-03-11 - 22KB
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2: Lanthanum Oxide-Based Gate Dielectrics for Integrated Circuit...
Lanthanum Oxide-Based Gate Dielectrics for Integrated Circuit Field Effect Transistors and Methods of Fabricating Same Application Type: Divisional Patent Number: 6753567 Country: ...
URL: https://www.src.org/library/patent/p0375/
Modified: 2004-06-22 - 22KB
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3: Lanthanum Oxide-Based Gate Dielectrics for Integrated Circuit...
Lanthanum Oxide-Based Gate Dielectrics for Integrated Circuit Field Effect Transistors and Methods of Fabricating Same Application Type: Foreign National Patent Number: NI154861 ...
URL: https://www.src.org/library/patent/p0580/
Modified: 2008-12-01 - 22KB
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4: High/Low Work Function Metal Alloys for Integrated Circuit Electrodes...
High/Low Work Function Metal Alloys for Integrated Circuit Electrodes and Methods of Fabricating Same Application Type: Utility Patent Number: 6873020 Country: United States ...
URL: https://www.src.org/library/patent/p0243/
Modified: 2005-03-29 - 22KB
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5: Low-Power, P-Channel Enhancement-Type Metal-Oxide Semiconductor...
Low-Power, P-Channel Enhancement-Type Metal-Oxide Semiconductor Field-Effect Transistor (PMOSFET) SRAM Cells Application Type: Utility Patent Number: 7286389 Country: United States ...
URL: https://www.src.org/library/patent/p0579/
Modified: 2007-10-23 - 24KB
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6: Binary Non-Crystalline Oxide Analogs of Silicon Dioxide for Use...
Binary Non-Crystalline Oxide Analogs of Silicon Dioxide for Use in Gate Dielectrics and Methods of Making the Same Application Type: Utility Patent Number: 6552403 Country: United ...
URL: https://www.src.org/library/patent/p0095/
Modified: 2003-04-22 - 24KB
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7: Binary Non-Crystalline Oxide Analogs of Silicon Dioxide for Use...
Binary Non-Crystalline Oxide Analogs of Silicon Dioxide for Use in Gate Dielectrics and Methods of Making the Same Application Type: Foreign National Patent Number: NI180834 ...
URL: https://www.src.org/library/patent/p0220/
Modified: 2003-11-11 - 24KB
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8: Binary Non-Crystalline Oxide Analogs of Silicon Dioxide for Use...
Binary Non-Crystalline Oxide Analogs of Silicon Dioxide for Use in Gate Dielectrics and Methods of Making the Same Application Type: Divisional Patent Number: 6686264 Country: ...
URL: https://www.src.org/library/patent/p0374/
Modified: 2004-02-03 - 24KB
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9: Multiple Copper Vias for Integrated Circuit Metallization and...
Multiple Copper Vias for Integrated Circuit Metallization and Methods of Fabricating Same Application Type: Utility Patent Number: 6919639 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0268/
Modified: 2005-07-19 - 22KB
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10: Semiconductor Devices Having an Interfacial Dielectric Layer...
Semiconductor Devices Having an Interfacial Dielectric Layer and Related Methods Application Type: Utility Patent Number: 7507629 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0450/
Modified: 2009-03-24 - 23KB
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11: Method of Forming Boron Carbo-Nitride Layers for Integrated Circuit...
Method of Forming Boron Carbo-Nitride Layers for Integrated Circuit Devices Application Type: Utility Patent Number: 7144803 Country: United States Status: Filed on 16-Apr-2004, ...
URL: https://www.src.org/library/patent/p0451/
Modified: 2006-12-05 - 22KB
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12: High Dielectric Constant Insulators and Associated Fabrication...
High Dielectric Constant Insulators and Associated Fabrication Methods Application Type: Utility Patent Number: 7994590 Country: United States Status: Filed on 30-Jan-2007, Issued ...
URL: https://www.src.org/library/patent/p1003/
Modified: 2011-08-09 - 22KB
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13: Multiple-Thickness Gate Oxide Formed by Oxygen Implantation ...
Multiple-Thickness Gate Oxide Formed by Oxygen Implantation - Method claims Application Type: Utility Patent Number: 6753229 Country: United States Status: Filed on 24-Nov-1999, ...
URL: https://www.src.org/library/patent/p0086/
Modified: 2004-06-22 - 26KB
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14: Fluorine Diffusion Barriers for Fuorinated Dielectrics in Integrated...
Fluorine Diffusion Barriers for Fuorinated Dielectrics in Integrated Circuits Application Type: Utility Patent Number: 6818990 Country: United States Status: Filed on 3-Apr-2000, ...
URL: https://www.src.org/library/patent/p0589/
Modified: 2004-11-16 - 22KB
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15: Atomic Layer Deposited (ALD) Oxide Semiconductors for Integrated...
Atomic Layer Deposited (ALD) Oxide Semiconductors for Integrated Circuits (ICS) Application Type: Utility Country: United States Status: Filed on 8-Dec-2021, Published by Patent ...
URL: https://www.src.org/library/patent/p2000/
Modified: 2021-12-08 - 23KB
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16: Integrated Circuit Implementation of Methods and Apparatuses...
Integrated Circuit Implementation of Methods and Apparatuses for Monitoring Occupancy of Wideband GHz Spectrum, and Sensing Respective Frequency Components of Time-Varying Signals ...
URL: https://www.src.org/library/patent/p1542/
Modified: 2016-04-02 - 26KB
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17: Integrated Circuit Implementation of Methods and Apparatuses...
Integrated Circuit Implementation of Methods and Apparatuses for Monitoring Occupancy of Wideband GHz Spectrum, and Sensing Respective Frequency Components of Time-Varying Signals ...
URL: https://www.src.org/library/patent/p1543/
Modified: 2014-11-19 - 26KB
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18: Integrated Circuit Devices Having On-Chip Adaptive Bandwidth...
Integrated Circuit Devices Having On-Chip Adaptive Bandwidth Buses and Related Methods Application Type: Utility Patent Number: 7110420 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0319/
Modified: 2006-09-19 - 23KB
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19: Methods of Generating Integrated Circuit (IC) Layout Synthetic...
Methods of Generating Integrated Circuit (IC) Layout Synthetic Patterns and Related Computer Program Products Application Type: Utility Patent Number: 11449658 Country: United ...
URL: https://www.src.org/library/patent/p1862/
Modified: 2022-09-20 - 24KB
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20: Systems and Methods for Testing Integrated Circuits (Patent P0342...
Systems and Methods for Testing Integrated Circuits Application Type: Utility Patent Number: 7032151 Country: United States Status: Filed on 13-Nov-2002, Issued on 18-Apr-2006, ...
URL: https://www.src.org/library/patent/p0342/
Modified: 2006-04-18 - 22KB
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21: Multiple-Thickness Gate Oxide Formed by Oxygen Implantation ...
Multiple-Thickness Gate Oxide Formed by Oxygen Implantation Application Type: Foreign National Patent Number: NI154458 Country: Taiwan Status: Filed on 1-Dec-1999, Issued on ...
URL: https://www.src.org/library/patent/p0211/
Modified: 2003-05-07 - 26KB
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22: Method for Diagnosing Bridging Faults in Integrated Circuits...
Method for Diagnosing Bridging Faults in Integrated Circuits Application Type: Utility Patent Number: 6202181 Country: United States Status: Filed on 3-Nov-1997, Issued on ...
URL: https://www.src.org/library/patent/p0199/
Modified: 2001-03-13 - 23KB
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23: Method for Diagnosing Bridging Faults in Integrated Circuits...
Method for Diagnosing Bridging Faults in Integrated Circuits Application Type: Continuation (in part) Patent Number: 6560736 Country: United States Status: Filed on 10-Jan-2001, ...
URL: https://www.src.org/library/patent/p0338/
Modified: 2003-05-06 - 23KB
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24: Multi-Layer Integrated Circuits Having Isolation Cells for Layer...
Multi-Layer Integrated Circuits Having Isolation Cells for Layer Testing and Related Methods Application Type: Continuation (in part) Patent Number: 10838003 Country: United States ...
URL: https://www.src.org/library/patent/p1826/
Modified: 2020-11-17 - 25KB
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25: Multi-Layer Integrated Circuits Having Isolation Cells for Layer...
Multi-Layer Integrated Circuits Having Isolation Cells for Layer Testing and Related Methods Application Type: Utility Patent Number: 10338133 Country: United States Status: Filed ...
URL: https://www.src.org/library/patent/p1639/
Modified: 2019-07-02 - 25KB
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26: Multiple-Thickness Gate Oxide Formed by Oxygen Implantation ...
Multiple-Thickness Gate Oxide Formed by Oxygen Implantation - device claims Application Type: Utility Patent Number: 6855994 Country: United States Status: Filed on 5-Sep-2001, ...
URL: https://www.src.org/library/patent/p0259/
Modified: 2005-02-15 - 26KB
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27: Method and Architecture for Pre-bond Probing of TSVs in 3D Stacked...
Method and Architecture for Pre-bond Probing of TSVs in 3D Stacked Integrated Circuits Application Type: Utility Patent Number: 8775108 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p1291/
Modified: 2014-07-08 - 22KB
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28: Method for Automatically Generating Test Vectors for Digital...
Method for Automatically Generating Test Vectors for Digital Integrated Circuits Application Type: Utility Patent Number: 5377197 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0059/
Modified: 1994-12-27 - 22KB
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29: Integrated Circuit With Topological Semimetal Interconnect (Patent...
Integrated Circuit With Topological Semimetal Interconnect Application Type: Utility Country: United States Status: Filed on 20-Jul-2022, Published by Patent Office Organization: ...
URL: https://www.src.org/library/patent/p2088/
Modified: 2022-07-20 - 25KB
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30: System and Method to Test Integrated Circuits on a Wafer (Patent...
System and Method to Test Integrated Circuits on a Wafer Application Type: Utility Patent Number: 7325180 Country: United States Status: Filed on 26-Nov-2003, Issued on ...
URL: https://www.src.org/library/patent/p0413/
Modified: 2008-01-29 - 22KB
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1 through 30 of 191 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 3 4 5 6 7 next >>