Questions?
[x] GRC Science Area
CADTS – Computer Aided Design & Test Sciences

Content Type
Events 30
Patent Filings 29
Other 1

SRC Program
GRC 45
SRC 15
FCRP 6
3D EC 4

Year
2015 1
2013 4
2012 2
2011 18
2010 5

Center
C2S2 10
FENA 8
GSRC 8
IFC 8
MSD 8
MuSyC 6
C-FAR 5
CNFD 5
FAME 5
INDEX 5
LEAST 5
SONIC 5
SWAN 5
TerraSwarm 5
TxACE 5
EBSM 3
NPT 2
ACE4S 1
CAIST 1
CDADIC 1
CEMPI 1
CHIRP 1
IPC 1
NCRC 1

Thrust/Theme
LPD – Logic & Physical Design 13
TT – Test & Testability 11
CADT – Computer-Aided Design and... 7
VER – Verification 7
Physical Design 3
AMS-CSD – Analog/Mixed-Signal Ci... 2
CD – Circuit Design 2
DV – Design Verification 2
HWS – Hardware Security 2
ISD – Integrated System Design 2
SLD – System Level Design 2
Synthesis & Verification 2
ADS – Alternative Device Structu... 1
AIHW – Artificial Intelligence H... 1
AMS – Analog and Mixed-Signal De... 1
AdvTech – Advanced Technology 1
Advanced Bipolar SOI-MOS Transis... 1
Advanced Devices 1
Advanced Devices & Technologies 1
Advanced Technology Option 1
Analysis Design & Simulation 1
BEP – Back End Processes 1
Back End Processes 1
C&S – Controls and Sensing 1
CFM&TCM – CFM & Total Chemical M... 1
CM – Compact Modeling 1
CSR – Cross-Disciplinary Semicon... 1
Contamination Control 1
Cost Reduction 1
DCMOS – Digital CMOS Technologie... 1
DE – Design Environment 1
DSMS – Device Sciences Modeling ... 1
Defect Reduction 1
Deposition 1
DesSyn – Design Synthesis 1
DesTech – Design Techniques 1
Doping Technologies 1
EP3C – Efficiency and Performanc... 1
ESH – Environment Safety and Hea... 1
Equip Automation & Process Contr... 1
Equip – Equipment 1
Equip. Auto. and Process Control 1
FACSYS – Factory Systems 1
FAM – Factory Automation & Manag... 1
FEOL – FEOL Processes 1
FacOps – Factory Operations 1
Factory Systems 1
Front End Processes 1
Heat Signal & Power Distribution 1
Heat Signal Power 1
I3T – Innovative and Intelligent... 1
Interconnect Architecture 1
LMD – Logic and Memory Devices 1
Lithography 1
Logic Design 1
Logistics & Modeling/Simulation 1
MT – Memory Technologies 1
MTMP – Metrology Tools Matls & P... 1
Masks 1
Materials 1
Materials & Measurements 1
Metrology 1
Modeling & Simulation 1
Modeling & TCAD 1
Multi-level Interconnect 1
NCR – Non-Classical CMOS Researc... 1
NEM – Nanoengineered Materials 1
NMP – Nanomanufacturing Material... 1
PAT – Patterning 1
PKG – Packaging 1
PMM – Packaging Materials and Me... 1
PMS – Packaging Modeling and Sim... 1
PS/E – Process Simplification/En... 1
Package & Electrical Design 1
Package Reliability 1
Packaging & Interconnect Systems 1
Packaging Materials Interfaces 1
Pat(MPS) – Patterning 1
PatMat – Patterning Materials 1
PatSys – Patterning Systems 1
PhyDes – Physical Design 1
Plasma Etch 1
Process Architecture 1
Processes – Processes 1
Quality & Reliability 1
Rapid Yield Learning 1
Reliability 1
Resist 1
SemiSynBio – Semiconductor Synth... 1
Semiconductor Modeling & Simulat... 1
Signal/Power Management 1
Substrates 1
TCAD-MBPS 1
TM – Thermal Management 1
TechCAD – Technology CAD 1

1 through 30 of 60 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 next >>
1: pdfFinal Report - Workshop on Failure and Uncertainty in Mixed-Signal...
National Science Foundation Workshop on Failure and Uncertainty in Mixed-Signal Circuits and Systems Arlington, Virginia July 8-9, 2010 Principal Investigators: Ralph Cavin, ...
URL: https://www.src.org/calendar/e004025/final-report.pdf
Modified: 2011-06-01 - 914KB
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2: pdfMicrosoft PowerPoint - Watson SRC TECHCON 090913 FINAL PUBLISH...
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URL: https://www.src.org/...004683/watson/talbot-techcon-2013.pdf
Modified: 2013-09-19 - 3.0MB
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3: pdfDesign Forum: Hugo De Man Position Statement
Some (possibly controversial) thoughts H. De Man, Em. Prof. K.U.Leuven, Senior Fellow IMEC, deman@imec.be The right questions are formulated. One could start suggestions for ...
URL: https://www.src.org/...764/hugo-deman-position-statement.pdf
Modified: 2011-08-02 - 36KB
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4: 3D IC University Research e-Workshop (Event E004357) - SRC
3D IC University Research e-Workshop Date: Thursday, May 5, 2011, noon-4:30 p.m. ET Location: SRC Conference Room D; via web conference, Research Triangle Park, NC, United States ...
URL: https://www.src.org/calendar/e004357/
Modified: 2011-11-05 - 43KB
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5: pdfSRC/NSF Design Forum - Position Statement
A Position Statement in the Forum on Future Directions for Design Automation Research Jason Cong UCLA Computer Science Department http://cadlab.cs.ucla.edu/~cong There are many ...
URL: https://www.src.org/...764/jason-cong-position-statement.pdf
Modified: 2011-08-02 - 35KB
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6: TECHCON 2013 (Event E004683) - SRC
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URL: https://www.src.org/calendar/e004683/
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7: Semiconductor Research Corporation - SRC
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URL: https://www.src.org/program/grc/
Modified: 2023-10-10 - 33KB
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8: Putting Watson to Work (TECHCON 2013) - SRC
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URL: https://www.src.org/calendar/e004683/watson/
Modified: 2013-09-09 - 21KB
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9: 2013 GRC SACC and TAB Chair Recognition - SRC
2013 GRC SACC and TAB Chair Recognition TAB and SACC Chairs at TECHCON 2013 Technical Advisory Boards (TABs) and Science Area Coordinating Committees (SACCs) work together with the ...
URL: https://www.src.org/calendar/e004683/tab-chair/
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10: TECHCON 2012 (Event E004114) - SRC
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URL: https://www.src.org/calendar/e004114/
Modified: 2013-03-11 - 98KB
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11: TECHCON 2011 (Event E004113) - SRC
TECHCON 2011 Date: Monday, Sept. 12, 2011, 8 a.m. - Tuesday, Sept. 13, 2011, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004113 E004113 ...
URL: https://www.src.org/calendar/e004113/
Modified: 2012-03-13 - 97KB
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12: pdfSlide 1
Third Annual India Design Review January 7-8, 2015 William H. Joyner, Jr. CADTS William.Joyner@src.org David C. Yeh ICSS David.Yeh@src.org Restricted Distribution: Contains SRC ...
URL: https://www.src.org/...r/e005563/2015_indiawelcome_final.pdf
Modified: 2015-02-04 - 319KB
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13: pdfPresentation Title
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URL: https://www.src.org/calendar/e004357/02-radojcic.pdf
Modified: 2011-05-04 - 2.4MB
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14: Cost Effective DAC Linearization System (Patent P1749) - SRC
Cost Effective DAC Linearization System Application Type: Utility Patent Number: 10218371 Country: United States Status: Filed on 1-Mar-2018, Issued on 26-Feb-2019 Organization: ...
URL: https://www.src.org/library/patent/p1749/
Modified: 2019-02-26 - 28KB
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15: Method and System for Systematic Defect Identification (Patent...
Method and System for Systematic Defect Identification Application Type: Utility Patent Number: 8509517 Country: United States Status: Filed on 29-Dec-2010, Issued on 13-Aug-2013 ...
URL: https://www.src.org/library/patent/p1262/
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16: Systems and Methods for Testing Integrated Circuits (Patent P0342...
Systems and Methods for Testing Integrated Circuits Application Type: Utility Patent Number: 7032151 Country: United States Status: Filed on 13-Nov-2002, Issued on 18-Apr-2006, ...
URL: https://www.src.org/library/patent/p0342/
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17: Method and System for Testing an Electric Circuit (Patent P1260...
Method and System for Testing an Electric Circuit Application Type: Utility Patent Number: 8742777 Country: United States Status: Filed on 29-Dec-2010, Issued on 3-Jun-2014, Patent ...
URL: https://www.src.org/library/patent/p1260/
Modified: 2014-06-03 - 22KB
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18: Method and Apparatus for Sampling and Predicting Rare Events...
Method and Apparatus for Sampling and Predicting Rare Events in Complex Electronic Devices, Circuits and Systems Application Type: Utility Patent Number: 8155938 Country: United ...
URL: https://www.src.org/library/patent/p1078/
Modified: 2012-04-10 - 24KB
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19: High Speed Data Converter Testing Devices, Methods, & System...
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URL: https://www.src.org/library/patent/p0612/
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20: Signal Tracing Using On-Chip Memory For In-System Post-Fabrication...
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URL: https://www.src.org/library/patent/p1495/
Modified: 2017-08-01 - 23KB
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21: Signal Tracing using ON-Chip Memory for In-System Post-Fabrication...
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URL: https://www.src.org/library/patent/p1733/
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22: System and Method for Testing a Logic-Based Processing Device...
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URL: https://www.src.org/library/patent/p1458/
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23: Systems and Methods for Electromagnetic Band Gap Structure Sythesis...
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URL: https://www.src.org/library/patent/p1039/
Modified: 2011-11-15 - 22KB
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24: pdfSlide 1
3D University Research Summit May 5 th , 2011 Restricted Distribution: Contains SRC Confidential Material Restricted Distribution: Contains SRC Confidential Material Summit Goals . ...
URL: https://www.src.org/calendar/e004357/0-intro.pdf
Modified: 2011-05-04 - 285KB
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25: Method and System for Synthesizing Relative Timing Constraints...
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URL: https://www.src.org/library/patent/p1354/
Modified: 2012-11-27 - 24KB
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26: Method and System for Synthesizing Relative Timing Constraints...
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URL: https://www.src.org/library/patent/p1202/
Modified: 2012-08-07 - 24KB
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27: Method and System for Performing Optical Proximity Correction...
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URL: https://www.src.org/library/patent/p1031/
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28: Method and System for Performing Global Routing on an Integrated...
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URL: https://www.src.org/library/patent/p1032/
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29: Method and System to Check Correspondence between Different Representa...
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URL: https://www.src.org/library/patent/p0476/
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30: Systems, Methods and Computer Program Products for Creating Hierarchic...
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1 through 30 of 60 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 next >>