Questions?
Content Type
Other 176
Events 166
Patent Filings 1

SRC Program
SRC 163
GRC 146
JUMP2 17
FCRP 6
NRI 6
3D EC 2
SRP 2
ERI 1
ICA 1
JUMP 1
STARnet 1
nCORE 1

Year
2024 7
2023 26
2022 28
2021 15
2020 4
2019 7
2018 10
2017 25
2016 14
2015 11
2014 5
2013 12
2012 33
2011 77
2010 63
2009 1
2008 1

Center
TxACE 6
CHIRP 5
EBSM 3
ACE4S 2
C2S2 2
FENA 2
GSRC 2
IFC 2
MSD 2
MuSyC 2
ACE 1
C-FAR 1
C-SPIN 1
CAIST 1
CDADIC 1
CEMPI 1
CUBIC 1
FAME 1
IPC 1
LEAST 1
NCRC 1
NPT 1
SONIC 1
TerraSwarm 1

Thrust/Theme
PKG – Packaging 8
HWS – Hardware Security 5
AMS-CSD – Analog/Mixed-Signal Ci... 4
CADT – Computer-Aided Design and... 3
ISD – Integrated System Design 3
SLD – System Level Design 3
AIHW – Artificial Intelligence H... 2
CD – Circuit Design 2
EP3C – Efficiency and Performanc... 2
ESH – Environment Safety and Hea... 2
I3T – Innovative and Intelligent... 2
LPD – Logic & Physical Design 2
NMP – Nanomanufacturing Material... 2
TT – Test & Testability 2
VER – Verification 2
ADS – Alternative Device Structu... 1
AMS – Analog and Mixed-Signal De... 1
AdvTech – Advanced Technology 1
Advanced Bipolar SOI-MOS Transis... 1
Advanced Devices 1
Advanced Devices & Technologies 1
Advanced Technology Option 1
Analysis Design & Simulation 1
BEP – Back End Processes 1
Back End Processes 1
C&S – Controls and Sensing 1
CFM&TCM – CFM & Total Chemical M... 1
CM – Compact Modeling 1
CSR – Cross-Disciplinary Semicon... 1
Contamination Control 1
Cost Reduction 1
DCMOS – Digital CMOS Technologie... 1
DE – Design Environment 1
DSMS – Device Sciences Modeling ... 1
DV – Design Verification 1
Defect Reduction 1
Deposition 1
DesSyn – Design Synthesis 1
DesTech – Design Techniques 1
Doping Technologies 1
Equip Automation & Process Contr... 1
Equip – Equipment 1
Equip. Auto. and Process Control 1
FACSYS – Factory Systems 1
FAM – Factory Automation & Manag... 1
FEOL – FEOL Processes 1
FacOps – Factory Operations 1
Factory Systems 1
Front End Processes 1
Heat Signal & Power Distribution 1
Heat Signal Power 1
IRP – India Research Program 1
Interconnect Architecture 1
LMD – Logic and Memory Devices 1
Lithography 1
Logic Design 1
Logistics & Modeling/Simulation 1
MT – Memory Technologies 1
MTMP – Metrology Tools Matls & P... 1
Masks 1
Materials 1
Materials & Measurements 1
Metrology 1
Modeling & Simulation 1
Modeling & TCAD 1
Multi-level Interconnect 1
NCR – Non-Classical CMOS Researc... 1
NEM – Nanoengineered Materials 1
PAT – Patterning 1
PMM – Packaging Materials and Me... 1
PMS – Packaging Modeling and Sim... 1
PS/E – Process Simplification/En... 1
Package & Electrical Design 1
Package Reliability 1
Packaging & Interconnect Systems 1
Packaging Materials Interfaces 1
Pat(MPS) – Patterning 1
PatMat – Patterning Materials 1
PatSys – Patterning Systems 1
PhyDes – Physical Design 1
Physical Design 1
Plasma Etch 1
Process Architecture 1
Processes – Processes 1
Quality & Reliability 1
Rapid Yield Learning 1
Reliability 1
Resist 1
SemiSynBio – Semiconductor Synth... 1
Semiconductor Modeling & Simulat... 1
Signal/Power Management 1
Substrates 1
Synthesis & Verification 1
TCAD-MBPS 1
TM – Thermal Management 1
TechCAD – Technology CAD 1

GRC Science Area
CADTS – Computer Aided Design & ... 10
ICSS – Integrated Circuit & Syst... 10
NMS – Nanomanufacturing Sciences 9
IPS – Interconnect & Packaging S... 7
SRCEA – SRC Education Alliance 6
PKG – Packaging Sciences 5
CSR – Cross-disciplinary Semicon... 2
DS – Device Sciences 2
DES – Design Sciences 1
ES-H – Environmental Safety & He... 1
FAC – Factory Sciences 1
GEN – General 1
INT – Interconnect Sciences 1
ISA – Industrial Support Activit... 1
LIT – Lithography Sciences 1
MBP – Materials & Bulk Processes... 1
MFG – Manufacturing Sciences 1
MFGPS – Manufacturing Process Sc... 1
MIC – Microstructure Sciences 1
MPS – Material & Process Science... 1
MSS – Manufacturing Systems Scie... 1
NIS – Nanostructure & Integratio... 1
PID – Process Integration & Devi... 1
SMS – Semiconductor Modeling & S... 1
TT – Technology Transfer 1

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91: 2008 GRC compelling research reasons - SRC
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91 through 120 of 343 similar documents, best matches first.   
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