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- 1:
Proposers' Conference for the Focus Center Research Program ...
- Proposers' Conference for the Focus Center Research Program Date: Monday, May 14, 2012, 11:30 a.m.-4 p.m. CT Location: Hyatt Regency DFW, Enterprise 7 & 8, Dallas, TX, United ...
URL: https://www.src.org/calendar/e004827/
Modified: 2012-11-14 - 49KB
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- 2:
Semiconductor Research Corporation - SRC
- FCRP FCRP Focus Center Research Program (Legacy) Multi-Scale Systems Research Center Creation of a comprehensive and a systematic solution to the distributed multi-scale system ...
URL: https://www.src.org/program/fcrp/
Modified: 2023-10-10 - 32KB
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- 3:
FAQs About the Focus Center Research Program - SRC
- FAQs About the Focus Center Research Program (FCRP) FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics ...
URL: https://www.src.org/program/fcrp/about/faq/
Modified: 2010-06-26 - 29KB
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- 4:
3D IC University Research e-Workshop (Event E004357) - SRC
- 3D IC University Research e-Workshop Date: Thursday, May 5, 2011, noon-4:30 p.m. ET Location: SRC Conference Room D; via web conference, Research Triangle Park, NC, United States ...
URL: https://www.src.org/calendar/e004357/
Modified: 2011-11-05 - 43KB
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- 5:
 FCRP Proposers' Conference
- FCRP Proposers' Conference Welcome!! Thank you for your interest! Objectives of this event: Learning and Teaming! Hearing perspectives from DARPA and Industry regarding ...
URL: https://www.src.org/calendar/e004827/weitzman.pdf
Modified: 2012-05-16 - 58KB
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- 6:
Carbon Electronics Workshop (Event E003973) - SRC
- Carbon Electronics Workshop Date: Tuesday, Sept. 21, 2010, 9 a.m. - Wednesday, Sept. 22, 2010, 1 p.m. ET Location: NanoFab 300, South Auditorium, CSNE, University of Albany-SUNY, ...
URL: https://www.src.org/calendar/e003973/
Modified: 2011-03-22 - 83KB
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- 7:
Focus Center Research Program Overview - SRC
- Focus Centers FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now being sponsored by ...
URL: https://www.src.org/program/fcrp/centers/
Modified: 2010-06-21 - 24KB
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- 8:
In-situ Studies of III-V Surfaces and High-k Atomic Layer Deposition...
- In-situ Studies of III-V Surfaces and High-k Atomic Layer Deposition Date: Tuesday, Oct. 23, 2012, 4 p.m.-5:30 p.m. ET Location: via web conference, Research Triangle Park, NC, ...
URL: https://www.src.org/calendar/e004519/
Modified: 2013-04-23 - 32KB
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- 9:
FCRP - About - SRC
- About Focus Center Research Program FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now ...
URL: https://www.src.org/program/fcrp/about/
Modified: 2010-06-27 - 22KB
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- 10:
About Circuit Design - SRC
- About Circuit Design Research at C2S2 FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now ...
URL: https://www.src.org/program/fcrp/c2s2/about/
Modified: 2010-06-21 - 25KB
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- 11:
Presentation Title
- PAGE 1 QUALCOMM CONFIDENTIAL AND PROPRIETARY QUALCOMM CONFIDENTIAL AND PROPRIETARY qctconnect.com 3D Through Si Stacking Technology - an IFM Perspective - RikoR May 11 PAGE 2 ...
URL: https://www.src.org/calendar/e004357/02-radojcic.pdf
Modified: 2011-05-04 - 2.4MB
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- 12:
About Interconnect - SRC
- About Interconnect Research at IFC FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now ...
URL: https://www.src.org/program/fcrp/ifc/about/
Modified: 2010-06-21 - 23KB
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- 13:
Past
- PAST FCRP workshop - M Mayberry, May 2012 Source: SRC website, Feb 2011 FCRP workshop - M Mayberry, May 2012 system software systems systems structures structures materials ...
URL: https://www.src.org/calendar/e004827/mayberry.pdf
Modified: 2012-05-16 - 3.4MB
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- 14:
3D IMAPS
- Tezzaron Semiconductor 05/05/2011 SRC 3D Summit Bob Patti, CTO rpatti@tezzaron.com 1 Tezzaron Semiconductor 05/05/2011 Why We Scale? 2 >180nm 90nm 65nm 130nm 45nm 28nm 22nm 16nm ...
URL: https://www.src.org/calendar/e004357/04-patti.pdf
Modified: 2011-05-04 - 4.4MB
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- 15:
About System Design at GSRC - SRC
- About System Design Research at GSRC FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now ...
URL: https://www.src.org/program/fcrp/gsrc/about/
Modified: 2010-06-21 - 22KB
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- 16:
About Complex Systems Design - SRC
- About Complex Systems Design Research at MuSyC FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics ...
URL: https://www.src.org/program/fcrp/musyc/about/
Modified: 2010-06-21 - 22KB
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- 17:
Comparator-Based Switched Capacitor Circuit for Scaled Semiconductor...
- Comparator-Based Switched Capacitor Circuit for Scaled Semiconductor Fabrication Processes Application Type: Utility Patent Number: 7319425 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0473/
Modified: 2008-01-15 - 21KB
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- 18:
Multi-Layer Semiconductor Structure Incorporating an Interference...
- Multi-Layer Semiconductor Structure Incorporating an Interference Shielding Portion Application Type: Utility Patent Number: 7067909 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0435/
Modified: 2006-06-27 - 21KB
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- 19:
Method of Forming a Multi-Layer Semiconductor Structure Having...
- Method of Forming a Multi-Layer Semiconductor Structure Having a Seam-Less Bonding Interface Application Type: Utility Patent Number: 7064055 Country: United States Status: Filed ...
URL: https://www.src.org/library/patent/p0434/
Modified: 2006-06-20 - 22KB
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- 20:
Vortex Tube Refrigeration Systems and Methods (Patent P0520)...
- Vortex Tube Refrigeration Systems and Methods Application Type: Utility Patent Number: 7669428 Country: United States Status: Filed on 14-Apr-2005, Issued on 2-Mar-2010, Patent ...
URL: https://www.src.org/library/patent/p0520/
Modified: 2010-03-02 - 22KB
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- 21:
Systems and Methods for Measuring I-Q Mismatch (Patent P1246...
- Systems and Methods for Measuring I-Q Mismatch Application Type: Utility Patent Number: 8526533 Country: United States Status: Filed on 24-May-2011, Issued on 3-Sep-2013 ...
URL: https://www.src.org/library/patent/p1246/
Modified: 2013-09-03 - 23KB
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- 22:
Multi-Tapped Inductively-Coupled Charging System (Patent P1417...
- Multi-Tapped Inductively-Coupled Charging System Application Type: Utility Patent Number: 9293942 Country: United States Status: Filed on 9-May-2013, Issued on 22-Mar-2016, Patent ...
URL: https://www.src.org/library/patent/p1417/
Modified: 2016-03-22 - 23KB
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- 23:
Systems and Methods for Distortion Measurement using
Distortion...
- Systems and Methods for Distortion Measurement using Distortion-to-Amplitude Transformations Application Type: Utility Patent Number: 8358169 Country: United States Status: Filed ...
URL: https://www.src.org/library/patent/p1637/
Modified: 2013-01-22 - 23KB
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- 24:
Power Conscious Self-Healing Transceiver Systems and Methods...
- Power Conscious Self-Healing Transceiver Systems and Methods Application Type: Utility Patent Number: 8983390 Country: United States Status: Filed on 17-May-2011, Issued on ...
URL: https://www.src.org/library/patent/p1278/
Modified: 2015-03-17 - 23KB
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- 25:
Semiconductor Light-Emitting Structure and Graded-Composition...
- Semiconductor Light-Emitting Structure and Graded-Composition Substrate Providing Yellow-Green Light Emission Application Type: Utility Patent Number: 8063397 Country: United ...
URL: https://www.src.org/library/patent/p1020/
Modified: 2011-11-22 - 22KB
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- 26:
Method of Forming a Multi-Layer Semiconductor Structure Incorporating...
- Method of Forming a Multi-Layer Semiconductor Structure Incorporating a Processing Handle Member Application Type: Utility Patent Number: 7307003 Country: United States Status: ...
URL: https://www.src.org/library/patent/p0575/
Modified: 2007-12-11 - 22KB
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- 27:
FCRP: Members - SRC
- Our Members Are Leading the Pack FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now ...
URL: https://www.src.org/program/fcrp/about/membership/
Modified: 2010-06-21 - 22KB
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- 28:
C2S2 Organizational Structure - SRC
- C2S2 Organizational Structure FCRP Legacy Content FCRP Phase V ended on 31-Jan-2013, and this content may no longer be current. Longer term microelectronics research is now being ...
URL: https://www.src.org/program/fcrp/c2s2/structure/
Modified: 2010-06-21 - 20KB
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- 29:
Self-Calibration Systems and Methods (Patent P0596) - SRC
- Self-Calibration Systems and Methods Application Type: Utility Patent Number: 7756663 Country: United States Status: Filed on 27-Jun-2006, Issued on 13-Jul-2010, Patent Abandoned ...
URL: https://www.src.org/library/patent/p0596/
Modified: 2010-07-13 - 21KB
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- 30:
Fluid-to-Fluid Spot-To-Spreader Heat Management Devices and Systems...
- Fluid-to-Fluid Spot-To-Spreader Heat Management Devices and Systems and Methods of Managing Heat Application Type: Utility Patent Number: 8082978 Country: United States Status: ...
URL: https://www.src.org/library/patent/p1037/
Modified: 2011-12-27 - 21KB
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