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Semiconductor Research Corporation and Georgia Tech Boost Off-chip Bandwidth While Driving Down Energy Per Bit
Gains in Off-chip Interconnect to Enable Continued Improvements for Chip Scaling, Packaging, System Performance
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FCRP Centers to Host Joint Annual Reviews
Join FCRP’s community for a review of research progress and hear about plans for upcoming work at one of the two Joint Annual Reviews scheduled for late September and early October.
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GRC CADTS Featured Publication
New technique for SRAM yield, reliability and testability analysis is 3-10x faster than current methods.
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GRC ICSS Featured Publication
A new multi-algorithm parallel circuit simulation approach can achieve superlinear overall speedup.
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GRC ICSS Featured Publication
A technique that monitors and delays specific IP block execution can reduce SoC peak temperature by 29 C.
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GRC ICSS Featured Publication
Crosstalk cancellation technique reduces power per bit per lane by 2X.
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GRC NMS Featured Publication
For the first time, graphene grown by CVD on OH terminated MgO exhibits a bandgap of ~ 1 eV.
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GRC ICSS Featured Publication
Unified transistor aging effects (NBTI, CHC, TDDB) models ready for industrial design use.
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GRC ICSS Featured Publication
Fundamental thermal conductivity of interdiffused Au/Al films was studied with thermoreflectance at nm scale
Featured Publication
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URO Program Completes a Successful First Year
Read the Year 1 (2009-2010) Final Report for URO Program
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INDEX/MSD Carbon Electronics Workshop and INDEX Review registration open
INDEX/MSD Carbon Electronics Workshop and INDEX Review September 21, 22 and 23
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University of Connecticut and Duke University Develop Unique Method to Improve Testing for Small Delay Defects in Semiconductors
Research Supported by Semiconductor Research Corporation and National Science Foundation Promises to Bolster Quality and Reliability of Semiconductor Products
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