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Patent Filings

SRC Program
GRC 443
STARnet 97
FCRP 72
JUMP 48
NRI 28
nCORE 22
MSR-Intel 4
ERI 1

Center
C-SPIN 37
TxACE 33
IFC 27
ACE4S 21
ASCENT 21
C2S2 20
LEAST 19
C-FAR 17
FAME 13
CRISP 11
GSRC 11
SONIC 9
CNFD 8
FENA 8
AMML 6
CBRIC 6
MSD 6
CONIX 5
IMPACT 5
NEWLIMITS 5
SWAN 5
WIN 5
ComSenTer 4
EBSM 4
ADA 3
Benchmarking 3
CEMPI 3
DEEP3M 3
E2CDA-NRI 3
INDEX 3
TerraSwarm 3
CAIST 1
CAPSL 1
CHIRP 1
E2CDA 1
MIND 1
MuSyC 1
NCRC 1
NRI-NSF 1
SGRC 1

Thrust/Theme
CD – Circuit Design 59
PAT – Patterning 43
TT – Test & Testability 35
Advanced Devices & Technologies 26
SLD – System Level Design 23
AMS-CSD – Analog/Mixed-Signal Ci... 22
I3T – Innovative and Intelligent... 22
HWS – Hardware Security 21
ISD – Integrated System Design 21
LPD – Logic & Physical Design 19
CADT – Computer-Aided Design and... 17
Factory Systems 17
NMP – Nanomanufacturing Material... 15
Pat(MPS) – Patterning 15
PKG – Packaging 14
BEP – Back End Processes 13
NEM – Nanoengineered Materials 13
ASCENT-T1 – Vertical CMOS 12
CRISP-T1 – Hardware Support for ... 9
ADS – Alternative Device Structu... 8
ASCENT-T2 – Beyond CMOS 8
DCMOS – Digital CMOS Technologie... 8
Back End Processes 7
AMML-T1 – Antiferromagnetic Magn... 6
DesTech – Design Techniques 6
Doping Technologies 6
MT – Memory Technologies 6
PatMat – Patterning Materials 6
CFM&TCM – CFM & Total Chemical M... 5
CONIX-T1 – ARENA Integrator 5
VER – Verification 5
CBRIC-T2 – Neuromorphic Fabrics 4
ESH – Environment Safety and Hea... 4
IMPACT-T1 – Materials for Scaled... 4
Packaging & Interconnect Systems 4
Physical Design 4
ADA-T1 – Deft Development 3
AIHW – Artificial Intelligence H... 3
DEEP3M-T4 – Architectures 3
MTMP – Metrology Tools Matls & P... 3
Masks 3
Materials 3
Modeling & Simulation 3
SemiSynBio – Semiconductor Synth... 3
TechCAD – Technology CAD 3
CBRIC-T1 – Neuro-inspired Algori... 2
CRISP-T3 – Scaling Applications ... 2
ComSenTer-T1 – Systems and Algor... 2
DesSyn – Design Synthesis 2
LMD – Logic and Memory Devices 2
NEWLIMITS-T2 – 2D Materials Devi... 2
Processes – Processes 2
AMS – Analog and Mixed-Signal De... 1
ASCENT-T4 – Merged Logic Memory ... 1
AdvTech – Advanced Technology 1
C&S – Controls and Sensing 1
CAPSL-T4 – Architectures and Sys... 1
CM – Compact Modeling 1
ComSenTer-T2 – mm-wave/THz ICs a... 1
ComSenTer-T3 – Application-speci... 1
DEEP3M-T2 – Circuits 1
DV – Design Verification 1
Deposition 1
E2CDA2 – E2CDA 2.0 1
Front End Processes 1
IMPACT-T2 – Materials for Storag... 1
Multi-level Interconnect 1
NEWLIMITS-T1 – Novel Computing a... 1
NEWLIMITS-T3 – Advanced Manufact... 1
NEWLIMITS-T4 – Characterization ... 1
Reliability 1
SMART-T1 – Spin-orbit Torque Mat... 1
Synthesis & Verification 1

GRC Science Area
ICSS – Integrated Circuit & Syst... 88
MPS – Material & Process Science... 85
NMS – Nanomanufacturing Sciences 79
CADTS – Computer Aided Design & ... 73
NIS – Nanostructure & Integratio... 50
LIT – Lithography Sciences 40
IPS – Interconnect & Packaging S... 31
DES – Design Sciences 29
MIC – Microstructure Sciences 28
PID – Process Integration & Devi... 28
DS – Device Sciences 26
MBP – Materials & Bulk Processes... 23
INT – Interconnect Sciences 11
MFGPS – Manufacturing Process Sc... 4
ES-H – Environmental Safety & He... 3
FAC – Factory Sciences 1

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1: Correlated Orbitals Yield High-Mobility, Back-End-of-Line Compatible...
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URL: https://www.src.org/library/patent/p2098/
Modified: 2022-12-20 - 25KB
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2: Atomic Layer Deposited (ALD) Oxide Semiconductors for Integrated...
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URL: https://www.src.org/library/patent/p2000/
Modified: 2021-12-08 - 23KB
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3: Micron Scale Tin Oxide-Based Semiconductor Devices (Patent P1886...
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URL: https://www.src.org/library/patent/p1886/
Modified: 2022-01-04 - 28KB
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4: Micron Scale Tin Oxide-Based Semiconductor Devices (Patent P2041...
Micron Scale Tin Oxide-Based Semiconductor Devices Application Type: Continuation Country: United States Status: Filed on 4-Jan-2022, Published by Patent Office Organization: ...
URL: https://www.src.org/library/patent/p2041/
Modified: 2022-01-04 - 28KB
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5: Low-Power, P-Channel Enhancement-Type Metal-Oxide Semiconductor...
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URL: https://www.src.org/library/patent/p0579/
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6: Optoelectronic Devices Having Arrays of Quantum Dot Compound...
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URL: https://www.src.org/library/patent/p0553/
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7: Optoelectronic Devices having Arrays of Quantum Dot Compound...
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URL: https://www.src.org/library/patent/p0443/
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8: Semiconductor Devices Having an Interfacial Dielectric Layer...
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9: Selective Deposition of Doped Silicon-Germanium Alloy on Semiconductor...
Selective Deposition of Doped Silicon-Germanium Alloy on Semiconductor Substrate, and Resulting Structures Application Type: Divisional Patent Number: 5336903 Country: United ...
URL: https://www.src.org/library/patent/p0063/
Modified: 1994-08-09 - 22KB
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10: Methods of Forming Nano-Scale Electronic and Optoelectronic Devices...
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URL: https://www.src.org/library/patent/p0301/
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11: Method for ALD Deposition on Inert Surfaces Via Al203 Nanoparticles...
Method for ALD Deposition on Inert Surfaces Via Al203 Nanoparticles Application Type: Utility Patent Number: 11127590 Country: United States Status: Filed on 5-Dec-2017, Issued on ...
URL: https://www.src.org/library/patent/p1750/
Modified: 2021-09-21 - 25KB
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12: Pattering Electronic Devices Reactive-Ion Etching of Tin Oxides...
Pattering Electronic Devices Reactive-Ion Etching of Tin Oxides Application Type: Continuation Country: United States Status: Filed on 9-Dec-2020, Published by Patent Office ...
URL: https://www.src.org/library/patent/p1946/
Modified: 2020-12-09 - 29KB
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13: Patterning Electronic Devices using Reactive-Ion Etching of Tin...
Patterning Electronic Devices using Reactive-Ion Etching of Tin Oxides Application Type: Utility Patent Number: 10868191 Country: United States Status: Filed on 6-Dec-2019, ...
URL: https://www.src.org/library/patent/p1879/
Modified: 2020-12-15 - 28KB
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14: Multiple-Thickness Gate Oxide Formed by Oxygen Implantation ...
Multiple-Thickness Gate Oxide Formed by Oxygen Implantation - device claims Application Type: Utility Patent Number: 6855994 Country: United States Status: Filed on 5-Sep-2001, ...
URL: https://www.src.org/library/patent/p0259/
Modified: 2005-02-15 - 26KB
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15: Multiple-Thickness Gate Oxide Formed by Oxygen Implantation ...
Multiple-Thickness Gate Oxide Formed by Oxygen Implantation - Method claims Application Type: Utility Patent Number: 6753229 Country: United States Status: Filed on 24-Nov-1999, ...
URL: https://www.src.org/library/patent/p0086/
Modified: 2004-06-22 - 26KB
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16: Multiple-Thickness Gate Oxide Formed by Oxygen Implantation ...
Multiple-Thickness Gate Oxide Formed by Oxygen Implantation Application Type: Foreign National Patent Number: NI154458 Country: Taiwan Status: Filed on 1-Dec-1999, Issued on ...
URL: https://www.src.org/library/patent/p0211/
Modified: 2003-05-07 - 26KB
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17: Method for In-Situ Dry Cleaning, Passivation, Functionalization...
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URL: https://www.src.org/library/patent/p1429/
Modified: 2017-11-14 - 25KB
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18: Method for in-SITU Dry Cleaning, Passivation, and Functionalization...
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URL: https://www.src.org/library/patent/p1477/
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19: Process for Forming Hafnium Oxide Films (Patent P0235) - SRC
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URL: https://www.src.org/library/patent/p0235/
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20: Method for Cleaning, Passivation and Functionalization of SI...
Method for Cleaning, Passivation and Functionalization of SI-GE Semiconductor Sufraces Application Type: Divisional Patent Number: 10483097 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p1734/
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21: Antiferromagnet Field-Effect Based Logic Circuits Including Spin...
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URL: https://www.src.org/library/patent/p1799/
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22: Binary Non-Crystalline Oxide Analogs of Silicon Dioxide for Use...
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URL: https://www.src.org/library/patent/p0095/
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23: Binary Non-Crystalline Oxide Analogs of Silicon Dioxide for Use...
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27: Germanium Silicon Dioxide Gate MOSFET (Patent P0098) - SRC
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29: Surface and Gas Phase Doping of III-V Semiconductors (Patent...
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30: Spin Transistor Having Multiferroic Gate Dielectric (Patent P1282...
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1 through 30 of 702 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 3 4 5 6 7 8 9 10 next >>