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GRC Science Area
CADTS – Computer Aided Design & Test Sciences
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- 1:
TECHCON 2010 Best in Session Awards - SRC
- TECHCON 2010 Best in Session Awards Seventeen students received Best in Session Awards at TECHCON 2010, presented by Dr. Michael Mayberry, Intel, SRC Board of Directors Member ...
URL: https://www.src.org/calendar/e003428/best-in-session/
Modified: 2010-09-29 - 26KB Find Similar Documents
- 2:
TECHCON 2013 (Event E004683) - SRC
- TECHCON 2013 Date: Monday, Sept. 9, 2013, 8 a.m. - Tuesday, Sept. 10, 2013, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004683 E004683 image ...
URL: https://www.src.org/calendar/e004683/
Modified: 2014-03-10 - 136KB Find Similar Documents
- 3:
TECHCON 2012 (Event E004114) - SRC
- TECHCON 2012 Date: Monday, Sept. 10, 2012, 8 a.m. - Tuesday, Sept. 11, 2012, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004114 E004114 ...
URL: https://www.src.org/calendar/e004114/
Modified: 2013-03-11 - 98KB Find Similar Documents
- 4:
TECHCON 2011 (Event E004113) - SRC
- TECHCON 2011 Date: Monday, Sept. 12, 2011, 8 a.m. - Tuesday, Sept. 13, 2011, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004113 E004113 ...
URL: https://www.src.org/calendar/e004113/
Modified: 2012-03-13 - 97KB Find Similar Documents
- 5:
Final Report - Workshop on Failure and Uncertainty in Mixed-Signal...
- National Science Foundation Workshop on Failure and Uncertainty in Mixed-Signal Circuits and Systems Arlington, Virginia July 8-9, 2010 Principal Investigators: Ralph Cavin, ...
URL: https://www.src.org/calendar/e004025/final-report.pdf
Modified: 2011-06-01 - 914KB Find Similar Documents
- 6:
TECHCON 2010 Preview - SRC
- TECHCON 2010 Preview TECHCON is the primary event where SRC presents the best of research sponsored by the membership and showcases the students who perform the research. It is ...
URL: https://www.src.org/calendar/e003428/preview/
Modified: 2010-07-28 - 24KB Find Similar Documents
- 7:
India Design Review (Event E005563) - SRC
- India Design Review Date: Wednesday, Jan. 7, 2015, 6 p.m. - Thursday, Jan. 8, 2015, 5 p.m. Local Location: Hyatt Bangalore, 1/1, Swami Vivekananda Road, Off M.G. Road, Ulsoor, ...
URL: https://www.src.org/calendar/e005563/
Modified: 2015-02-04 - 82KB Find Similar Documents
- 8:
Semiconductor Research Corporation - SRC
- GRC GRC Global Research Collaboration Our motivation is to fund the most relevant and critical research for international companies, so we go where the best university talent ...
URL: https://www.src.org/program/grc/
Modified: 2023-10-10 - 33KB Find Similar Documents
- 9:
TECHCON 2010: A Tradition of High Quality - SRC
- TECHCON 2010: Technology and Talent for the 21st Century A Tradition of High Quality Since its inception in 1990, the quality of presentations at TECHCON Conferences has gotten ...
URL: https://www.src.org/calendar/e003428/tradition/
Modified: 2010-06-21 - 21KB Find Similar Documents
- 10:
Posters: Undergraduate Research Opportunities (URO) - SRC
- TECHCON 2011 TECHCON 2011 Posters - Undergraduate Research Opportunities Room: RioGrande A Back to Session Listing URO Posters Poster Number Presentation Time Title Presenter & ...
URL: https://www.src.org/calendar/e004113/uro-posters/
Modified: 2011-06-30 - 27KB Find Similar Documents
- 11:
Putting Watson to Work (TECHCON 2013) - SRC
- Putting Watson to Work TECHCON 2013 Special Session Richard Talbot, Director, PLM of the IBM Poser Systems View presentation as PDF Presented: Monday, September 9 at TECHCON 2013 ...
URL: https://www.src.org/calendar/e004683/watson/
Modified: 2013-09-09 - 21KB Find Similar Documents
- 12:
Method and System for Synthesizing Relative Timing Constraints...
- Method and System for Synthesizing Relative Timing Constraints on an Integrated Circuit Design to Facilitate Timing Verification Application Type: Continuation Patent Number: ...
URL: https://www.src.org/library/patent/p1354/
Modified: 2012-11-27 - 24KB Find Similar Documents
- 13:
Method and System for Synthesizing Relative Timing Constraints...
- Method and System for Synthesizing Relative Timing Constraints on an Integrated Circuit Design to Facilitate Timing Verification Application Type: Utility Patent Number: 8239796 ...
URL: https://www.src.org/library/patent/p1202/
Modified: 2012-08-07 - 24KB Find Similar Documents
- 14:
Description
- Call for Abstracts Call for abstracts opens Monday, January 16, 2012. Deadline for submission is 3:00 p.m. eastern time on Wednesday, February 22, 2012. Description TECHCON is ...
URL: https://www.src.org/calendar/e004114/call-for-abstracts.pdf
Modified: 2012-01-26 - 27KB Find Similar Documents
- 15:
Method and System to Check Correspondence between Different Representa...
- Method and System to Check Correspondence between Different Representations of a Circuit Application Type: Continuation (in part) Patent Number: 7418680 Country: United States ...
URL: https://www.src.org/library/patent/p0476/
Modified: 2008-08-26 - 22KB Find Similar Documents
- 16:
Systems, Methods and Computer Program Products for Creating Hierarchic...
- Systems, Methods and Computer Program Products for Creating Hierarchical Equivalent Circuit Models Application Type: Utility Patent Number: 7096174 Country: United States Status: ...
URL: https://www.src.org/library/patent/p0200/
Modified: 2006-08-22 - 24KB Find Similar Documents
- 17:
Method and System to Verify a Circuit Design By Verifying Consistency...
- Method and System to Verify a Circuit Design By Verifying Consistency Between Two Different Language Representations of a Circuit Design Application Type: Utility Patent Number: ...
URL: https://www.src.org/library/patent/p0424/
Modified: 2007-05-29 - 22KB Find Similar Documents
- 18:
Formal Verification of a Logic Design Through Implicit Enumeration...
- Formal Verification of a Logic Design Through Implicit Enumeration of Strongly Connected Components Application Type: Utility Patent Number: 6526551 Country: United States Status: ...
URL: https://www.src.org/library/patent/p0189/
Modified: 2003-02-25 - 22KB Find Similar Documents
- 19:
System and Method to Test Integrated Circuits on a Wafer (Patent...
- System and Method to Test Integrated Circuits on a Wafer Application Type: Utility Patent Number: 7325180 Country: United States Status: Filed on 26-Nov-2003, Issued on ...
URL: https://www.src.org/library/patent/p0413/
Modified: 2008-01-29 - 22KB Find Similar Documents
- 20:
E003932 - Variability Forum - Opening20100430
- The 1st International Variability Characterization Workshop 2 Organizing Committee Yao-Wen Chang National Taiwan University Costas J. Spanos Univ. of California, Berkeley William ...
URL: https://www.src.org/calendar/e003932/e003932_s0_opening.pdf
Modified: 2010-06-29 - 597KB Find Similar Documents
- 21:
MEMORANDUM TO: TECHCON 2010 Judges FROM: Harold Hosack, TECHCON...
- MEMORANDUM TO: TECHCON 2010 Judges FROM: Harold Hosack, TECHCON 2010 Judges Chair DATE: August 9, 2010 SUBJECT: Judges Information Information that you will need for judging paper/...
URL: https://www.src.org/calendar/e003428/judge-letter.pdf
Modified: 2010-08-09 - 17KB Find Similar Documents
- 22:
TECHCON 2010 Evaluation Summary - SRC
- TECHCON 2010 Evaluation Summary Overall, 134 TECHCON attendees returned evaluations; breakdown by question is: The papers/posters presented indicate research of value to the ...
URL: https://www.src.org/calendar/e003428/evaluation/
Modified: 2010-09-30 - 26KB Find Similar Documents
- 23:
MEMORANDUM
- MEMORANDUM TO: TECHCON 2011 Session Chairs, Vice Chairs, Judges FROM: Harold Hosack, TECHCON 2011 Judges Chair DATE: August 12, 2011 SUBJECT: Chairs, Vice Chairs, Judges ...
URL: https://www.src.org/calendar/e004113/letter-judges.pdf
Modified: 2011-08-10 - 22KB Find Similar Documents
- 24:
E003932 - Variability Forum - Spanos
- 1 University of California . Berkeley . EECS . C. J. Spanos . 4/30/2010 Statistical Description of Process Variability First International Variability Characterization Workshop ...
URL: https://www.src.org/calendar/e003932/e003932_s2_1_spanos.pdf
Modified: 2010-06-29 - 2.8MB Find Similar Documents
- 25:
Slide 1
- Third Annual India Design Review January 7-8, 2015 William H. Joyner, Jr. CADTS William.Joyner@src.org David C. Yeh ICSS David.Yeh@src.org Restricted Distribution: Contains SRC ...
URL: https://www.src.org/...r/e005563/2015_indiawelcome_final.pdf
Modified: 2015-02-04 - 319KB Find Similar Documents
- 26:
Method, Apparatus and Computer Program Product for Determining...
- Method, Apparatus and Computer Program Product for Determining a Frequency Domain Response of a Nonlinear Microelectronic Circuit Application Type: Utility Patent Number: 5663890 ...
URL: https://www.src.org/library/patent/p0014/
Modified: 1997-09-02 - 24KB Find Similar Documents
- 27:
3D IC University Research e-Workshop (Event E004357) - SRC
- 3D IC University Research e-Workshop Date: Thursday, May 5, 2011, noon-4:30 p.m. ET Location: SRC Conference Room D; via web conference, Research Triangle Park, NC, United States ...
URL: https://www.src.org/calendar/e004357/
Modified: 2011-11-05 - 43KB Find Similar Documents
- 28:
TECHCON 2003
- Instructions for Session Judges 1. Please check in at conference registration on the plaza level after arriving and checking in at the hotel. The judge's packet will be provided ...
URL: https://www.src.org/calendar/e004683/judges-instructions.pdf
Modified: 2013-07-24 - 90KB Find Similar Documents
- 29:
2010 Inventor Recognition Award Winners - SRC
- Inventor Recognition Awards Presented at TECHCON 2010 [Note: The following is the presentation of the 2009 Inventor Recognition Awards by Elizabeth Weitzman, SRC Executive Vice ...
URL: https://www.src.org/calendar/e003428/inventor/
Modified: 2010-09-29 - 21KB Find Similar Documents
- 30:
Quantifier Elimination by Dependency Sequents (Patent P1309)...
- Quantifier Elimination by Dependency Sequents Application Type: Utility Patent Number: 8438513 Country: United States Status: Filed on 30-Dec-2011, Issued on 7-May-2013, Patent ...
URL: https://www.src.org/library/patent/p1309/
Modified: 2013-05-07 - 22KB Find Similar Documents
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