Questions?
[x] SRC Program
GRC

Content Type
Events 98
Other 84
Patent Filings 23

Year
2023 8
2022 9
2021 3
2020 5
2019 7
2018 4
2017 4
2016 8
2015 7
2014 2
2013 3
2012 1
2011 93
2010 25
2009 1
2008 1

Center
ACE4S 22
TxACE 6
CHIRP 5
CAIST 1
CDADIC 1
CEMPI 1
EBSM 1
IPC 1
NCRC 1

Thrust/Theme
I3T – Innovative and Intelligent... 22
SLD – System Level Design 22
CD – Circuit Design 18
ISD – Integrated System Design 8
PKG – Packaging 8
AMS-CSD – Analog/Mixed-Signal Ci... 4
HWS – Hardware Security 4
AIHW – Artificial Intelligence H... 2
CADT – Computer-Aided Design and... 2
EP3C – Efficiency and Performanc... 2
LPD – Logic & Physical Design 2
TT – Test & Testability 2
VER – Verification 2
ADS – Alternative Device Structu... 1
AMS – Analog and Mixed-Signal De... 1
AdvTech – Advanced Technology 1
Advanced Bipolar SOI-MOS Transis... 1
Advanced Devices 1
Advanced Devices & Technologies 1
Advanced Technology Option 1
Analysis Design & Simulation 1
BEP – Back End Processes 1
Back End Processes 1
C&S – Controls and Sensing 1
CFM&TCM – CFM & Total Chemical M... 1
CM – Compact Modeling 1
CSR – Cross-Disciplinary Semicon... 1
Contamination Control 1
Cost Reduction 1
DCMOS – Digital CMOS Technologie... 1
DE – Design Environment 1
DSMS – Device Sciences Modeling ... 1
DV – Design Verification 1
Defect Reduction 1
Deposition 1
DesSyn – Design Synthesis 1
DesTech – Design Techniques 1
Doping Technologies 1
ESH – Environment Safety and Hea... 1
Equip Automation & Process Contr... 1
Equip – Equipment 1
Equip. Auto. and Process Control 1
FACSYS – Factory Systems 1
FAM – Factory Automation & Manag... 1
FEOL – FEOL Processes 1
FacOps – Factory Operations 1
Factory Systems 1
Front End Processes 1
Heat Signal & Power Distribution 1
Heat Signal Power 1
Interconnect Architecture 1
LMD – Logic and Memory Devices 1
Lithography 1
Logic Design 1
Logistics & Modeling/Simulation 1
MT – Memory Technologies 1
MTMP – Metrology Tools Matls & P... 1
Masks 1
Materials 1
Materials & Measurements 1
Metrology 1
Modeling & Simulation 1
Modeling & TCAD 1
Multi-level Interconnect 1
NCR – Non-Classical CMOS Researc... 1
NEM – Nanoengineered Materials 1
NMP – Nanomanufacturing Material... 1
PAT – Patterning 1
PMM – Packaging Materials and Me... 1
PMS – Packaging Modeling and Sim... 1
PS/E – Process Simplification/En... 1
Package & Electrical Design 1
Package Reliability 1
Packaging & Interconnect Systems 1
Packaging Materials Interfaces 1
Pat(MPS) – Patterning 1
PatMat – Patterning Materials 1
PatSys – Patterning Systems 1
PhyDes – Physical Design 1
Physical Design 1
Plasma Etch 1
Process Architecture 1
Processes – Processes 1
Quality & Reliability 1
Rapid Yield Learning 1
Reliability 1
Resist 1
SemiSynBio – Semiconductor Synth... 1
Semiconductor Modeling & Simulat... 1
Signal/Power Management 1
Substrates 1
Synthesis & Verification 1
TCAD-MBPS 1
TM – Thermal Management 1
TechCAD – Technology CAD 1

GRC Science Area
ICSS – Integrated Circuit & Syst... 32
CADTS – Computer Aided Design & ... 10
IPS – Interconnect & Packaging S... 7
PKG – Packaging Sciences 5
NMS – Nanomanufacturing Sciences 4
CSR – Cross-disciplinary Semicon... 1
DES – Design Sciences 1
DS – Device Sciences 1
ES-H – Environmental Safety & He... 1
FAC – Factory Sciences 1
GEN – General 1
INT – Interconnect Sciences 1
ISA – Industrial Support Activit... 1
LIT – Lithography Sciences 1
MBP – Materials & Bulk Processes... 1
MFG – Manufacturing Sciences 1
MFGPS – Manufacturing Process Sc... 1
MIC – Microstructure Sciences 1
MPS – Material & Process Science... 1
MSS – Manufacturing Systems Scie... 1
NIS – Nanostructure & Integratio... 1
PID – Process Integration & Devi... 1
SMS – Semiconductor Modeling & S... 1
SRCEA – SRC Education Alliance 1
TT – Technology Transfer 1

181 through 205 of 205 similar documents, best matches first.   
<< previous Page: 1 2 3 4 5 6 7 Results by:Thunderstone
181: pdfSRC Research Challenges in Test and Testability
1 Research Challenges in Test and Testability Semiconductor Research Corporation August 17, 2006 Introduction Test and design for testability are recognized today as critical to a ...
URL: https://www.src.org/...rc/cadts/research-needs/2006-test.pdf
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182: pdfMicrosoft Word - Final 2004 Needs.doc
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183: pdfMicrosoft Word - Final 2004 Needs.doc
1 Draft 5/14/2004 Back End Processing (BEP) Needs Statement I. Introduction- The purpose of this document is to define the needs of the SRC member companies in the area of Back ...
URL: https://www.src.org/...m/grc/ips/research-needs/2004/bep.pdf
Modified: 2010-06-21 - 47KB
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184: pdfE003676 - Memory Forum - Materials for ReRAM
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185: pdfVIA-2020 Forum - Panel 3 - Nair
Evolution of Computer Architectures Ravi Nair IBM Thomas J. Watson Research Center Yorktown Heights, NY July 10, 2008 RN 7/10/08 2 Thanks to Dan Prener for collaboration and useful ...
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186: pdfChip Level Materials: Challenges and Potential Solutions
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URL: https://www.src.org/calendar/e005568/e005568-candelaria.pdf
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187: pdf2010 NMS Research Needs in patterning, nanoengineered materials...
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URL: https://www.src.org/...ms/research-needs/2010/patterning.pdf
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188: Mitigating the Negative Effects of Powered ESD on Integrated...
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URL: https://www.src.org/calendar/e006609/
Modified: 2020-12-18 - 30KB
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189: pdfSRC 2003 CADTS Research Needs in test and Testability V4.doc
6/1/2003 rev 0 page 1 of 9 Research Needs in Test and Testability Semiconductor Research Corporation June 1, 2003 INTRODUCTION Until recently, the development of tests for circuits ...
URL: https://www.src.org/...rc/cadts/research-needs/2003/test.pdf
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190: pdfCyber Physical Systems Looking Into the Future
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URL: https://www.src.org/calendar/e003506/02-sessionii-znati.pdf
Modified: 2011-06-17 - 3.0MB
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191: pdfIRP Advisory Board Meeting
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URL: https://www.src.org/.../1_2023-ekickoff-pkg-introduction.pdf
Modified: 2023-03-27 - 535KB
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192: pdfResearch Needs in Computer-Aided Design: Logic and Physical...
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URL: https://www.src.org/...grc/cadts/research-needs/2001/lpd.pdf
Modified: 2011-01-26 - 28KB
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193: pdf3D IMAPS
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URL: https://www.src.org/calendar/e004357/04-patti.pdf
Modified: 2011-05-04 - 4.4MB
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194: pdf2009 Summer Study: Architecture and Appliction Perspectives for...
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URL: https://www.src.org/...2009s-study-siii-architecture-xie.pdf
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195: pdfMassive Data Computing in a Connected World
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URL: https://www.src.org/calendar/e003506/05-sessionii-dubey.pdf
Modified: 2011-06-17 - 1.2MB
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196: pdfGRC SRC: Nano-Morphic Forum - P3 Shin
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URL: https://www.src.org/calendar/e003062/shin.pdf
Modified: 2011-08-02 - 1.5MB
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197: pdfDevice Sciences, Semiconductor Research Corp. (SRC)
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198: pdfE003676 - Memory Forum - NV-Memory Elemets with Gate-All-Around...
NV-Memory Elements with Gate-All-Around Transistors Patrick Lo Guo-Qiang Institute of Microelectronics, A*STAR, Singapore SRC/NSF/A*STAR Memory Forum, Oct. 20-21, 2009 Outline . ...
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Modified: 2010-07-29 - 1.2MB
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199: pdfMicrosoft Word - Executive Summary Naydenov
1 Participants only: Not for distribution. 2nd Deterministic Doping Workshop November 12, 2010, UC Berkeley Executive Summary Title: Nitrogen-Vacancy Centers in Diamond - ...
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Modified: 2010-11-09 - 91KB
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200: pdf2009 Summer Study: NRI Program Directions and Promising Outputs
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URL: https://www.src.org/calendar/e003506/04-sessioni-welser.pdf
Modified: 2011-06-17 - 991KB
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201: pdfVIA-2020 Forum - Panel 2 - Vahid
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URL: https://www.src.org/calendar/e003362/p2-vahid.pdf
Modified: 2011-04-18 - 688KB
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202: pdfVIA-2020 Forum - Panel 1 - McDonald
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URL: https://www.src.org/calendar/e003362/p1-mcdonald.pdf
Modified: 2011-04-18 - 4.7MB
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203: pdfE003676 - Memory Forum - Strukov
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URL: https://www.src.org/calendar/e003676/strukov.pdf
Modified: 2010-07-29 - 1.4MB
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204: pdfMicrosoft PowerPoint - etab_jun09.ppt [Compatibility Mode]
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Modified: 2011-06-17 - 473KB
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205: pdfSRC Workshop on EDA/BDA Interaction Roadmap - Final Report
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URL: https://www.src.org/...098-eda-bda-workshop-final-report.pdf
Modified: 2017-05-26 - 5.5MB
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181 through 205 of 205 similar documents, best matches first.   
<< previous Page: 1 2 3 4 5 6 7 Results by:Thunderstone