Questions?
Content Type
Other 357
Events 266
Patent Filings 15

SRC Program
SRC 311
GRC 281
JUMP2 21
NRI 11
FCRP 8
3D EC 5
SRP 3
Auto 2
ICA 1
JUMP 1
NINE 1
nCORE 1

Year
2024 16
2023 33
2022 43
2021 30
2020 13
2019 18
2018 24
2017 33
2016 20
2015 19
2014 17
2013 19
2012 37
2011 177
2010 121
2009 1

Center
TxACE 16
C2S2 11
FENA 11
GSRC 11
IFC 11
MSD 11
MuSyC 7
CHIRP 6
EBSM 5
CNFD 3
INDEX 3
SWAN 3
C-FAR 2
E2CDA-NRI 2
FAME 2
LEAST 2
SONIC 2
TerraSwarm 2
ACE 1
ACE4S 1
CAIST 1
CDADIC 1
CEMPI 1
CUBIC 1
IPC 1
NCRC 1
NPT 1
SUPREME 1

Thrust/Theme
TT – Test & Testability 15
PKG – Packaging 11
AMS-CSD – Analog/Mixed-Signal Ci... 8
CADT – Computer-Aided Design and... 8
HWS – Hardware Security 8
ESH – Environment Safety and Hea... 5
SLD – System Level Design 5
CD – Circuit Design 4
ISD – Integrated System Design 4
LPD – Logic & Physical Design 4
VER – Verification 4
NMP – Nanomanufacturing Material... 3
AIHW – Artificial Intelligence H... 2
I3T – Innovative and Intelligent... 2
ADS – Alternative Device Structu... 1
AMS – Analog and Mixed-Signal De... 1
AdvTech – Advanced Technology 1
Advanced Bipolar SOI-MOS Transis... 1
Advanced Devices 1
Advanced Devices & Technologies 1
Advanced Technology Option 1
Analysis Design & Simulation 1
BEP – Back End Processes 1
Back End Processes 1
C&S – Controls and Sensing 1
CFM&TCM – CFM & Total Chemical M... 1
CM – Compact Modeling 1
CSR – Cross-Disciplinary Semicon... 1
Contamination Control 1
Cost Reduction 1
DCMOS – Digital CMOS Technologie... 1
DE – Design Environment 1
DSMS – Device Sciences Modeling ... 1
DV – Design Verification 1
Defect Reduction 1
Deposition 1
DesSyn – Design Synthesis 1
DesTech – Design Techniques 1
Doping Technologies 1
EP3C – Efficiency and Performanc... 1
Equip Automation & Process Contr... 1
Equip – Equipment 1
Equip. Auto. and Process Control 1
FACSYS – Factory Systems 1
FAM – Factory Automation & Manag... 1
FEOL – FEOL Processes 1
FacOps – Factory Operations 1
Factory Systems 1
Front End Processes 1
Heat Signal & Power Distribution 1
Heat Signal Power 1
Interconnect Architecture 1
LMD – Logic and Memory Devices 1
Lithography 1
Logic Design 1
Logistics & Modeling/Simulation 1
MT – Memory Technologies 1
MTMP – Metrology Tools Matls & P... 1
Masks 1
Materials 1
Materials & Measurements 1
Metrology 1
Modeling & Simulation 1
Modeling & TCAD 1
Multi-level Interconnect 1
NCR – Non-Classical CMOS Researc... 1
NEM – Nanoengineered Materials 1
PAT – Patterning 1
PMM – Packaging Materials and Me... 1
PMS – Packaging Modeling and Sim... 1
PS/E – Process Simplification/En... 1
Package & Electrical Design 1
Package Reliability 1
Packaging & Interconnect Systems 1
Packaging Materials Interfaces 1
Pat(MPS) – Patterning 1
PatMat – Patterning Materials 1
PatSys – Patterning Systems 1
PhyDes – Physical Design 1
Physical Design 1
Plasma Etch 1
Process Architecture 1
Processes – Processes 1
Quality & Reliability 1
Rapid Yield Learning 1
Reliability 1
Resist 1
SemiSynBio – Semiconductor Synth... 1
Semiconductor Modeling & Simulat... 1
Signal/Power Management 1
Substrates 1
Synthesis & Verification 1
TCAD-MBPS 1
TM – Thermal Management 1
TechCAD – Technology CAD 1

GRC Science Area
CADTS – Computer Aided Design & ... 57
ICSS – Integrated Circuit & Syst... 32
NMS – Nanomanufacturing Sciences 24
IPS – Interconnect & Packaging S... 18
CSR – Cross-disciplinary Semicon... 13
DS – Device Sciences 13
SRCEA – SRC Education Alliance 8
PKG – Packaging Sciences 6
DES – Design Sciences 3
ES-H – Environmental Safety & He... 3
FAC – Factory Sciences 1
GEN – General 1
INT – Interconnect Sciences 1
ISA – Industrial Support Activit... 1
LIT – Lithography Sciences 1
MBP – Materials & Bulk Processes... 1
MFG – Manufacturing Sciences 1
MFGPS – Manufacturing Process Sc... 1
MIC – Microstructure Sciences 1
MPS – Material & Process Science... 1
MSS – Manufacturing Systems Scie... 1
NIS – Nanostructure & Integratio... 1
PID – Process Integration & Devi... 1
SMS – Semiconductor Modeling & S... 1
TT – Technology Transfer 1

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1: pdfSRC 2003 CADTS Research Needs in test and Testability V4.doc
Research Challenges in Test and Testability Semiconductor Research Corporation March 2013 Introduction Test and design for testability are recognized today as critical to a ...
URL: https://www.src.org/...rc/cadts/research-needs/2013/test.pdf
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2: pdfTest Needs to Augment SRC Test and Testability Portfolio
Test Needs to Augment SRC Test and Testability Portfolio The SRC member companies have identified research needs in test and testability not now adequately addressed in the SRC ...
URL: https://www.src.org/...rc/cadts/research-needs/2000/test.pdf
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3: pdfSRC CADTS Research Needs in Test and Testability
2001 Research Needs for Test and Testability Page 1 of 3 05/14/01 Semiconductor Research Corporation Computer Aided Design and Test Sciences Research Needs in Test and Testability ...
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4: pdfSRC CADTS Research Needs in Test and Testability
2001 Research Needs for Test and Testability Page 1 of 3 05/14/01 Semiconductor Research Corporation Computer Aided Design and Test Sciences Research Needs in Test and Testability ...
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5: pdfSRC 2003 CADTS Research Needs in test and Testability V4.doc
6/1/2003 rev 0 page 1 of 9 Research Needs in Test and Testability Semiconductor Research Corporation June 1, 2003 INTRODUCTION Until recently, the development of tests for circuits ...
URL: https://www.src.org/...rc/cadts/research-needs/2003/test.pdf
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6: pdf2010 Test Needs Document
1 Research Challenges in Test and Testability Semiconductor Research Corporation January 2010 Introduction Test and design for testability are recognized today as critical to a ...
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7: pdfSRC Research Challenges in Test and Testability
1 Research Challenges in Test and Testability Semiconductor Research Corporation August 17, 2006 Introduction Test and design for testability are recognized today as critical to a ...
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8: pdfFinal Report - Workshop on Failure and Uncertainty in Mixed-Signal...
National Science Foundation Workshop on Failure and Uncertainty in Mixed-Signal Circuits and Systems Arlington, Virginia July 8-9, 2010 Principal Investigators: Ralph Cavin, ...
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9: 2005 GRC Compelling Research Report - SRC
2005 GRC Compelling Research Reasons Advanced Micro Devices, Inc. next company Newly Recognized ID Science Areas Title PI Start Date 658 Nanostructure & Integration Sciences Role ...
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10: pdf2012 - 2016 SRC-GRC Strategic Plan - DRAFT II
1 2012-2016 SRC-GRC Strategic Plan Limited Distribution Notice Distribution of the material in this document is limited to employees of SRC-GRC member companies or participating ...
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11: pdf2011-2015 SRC-GRC Strategic Plan
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12: pdfSRC Needs Document: Logic, Physical, and Electrical Design and...
SRC Needs Document Logic, Physical, and Electrical Design and Analysis Tools June 2004 / December 2005 Research needs in design tools are driven by both constant and changing ...
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Research Challenges in Computer-Aided Design and Test June 2019 The Computer-Aided Design and Test (CADT) research program at the Semiconductor Research Corporation (SRC) is ...
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14: pdfSemiconductor Research Corporation
Research Challenges in CAD and Test Semiconductor Research Corporation March 2016 The Computer-Aided Design and Test thrust at the Semiconductor Research Corporation is soliciting ...
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1 Summary Report for the SRC/NSF Workshop on Verification, Validation, and Test of Machine Learning (V-TML) Systems Workshop Dates: July 24 - 25, 2018 Workshop Location: Holiday ...
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16: pdf2006 Circuit Design Needs Categories
Research Needs: Analog/Mixed-Signal Circuits, Systems, and Devices (AMS-CSD) + TxACE April 10, 2023 Semiconductor Research Corporation (SRC), Durham, NC 27703 1 The Semiconductor ...
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18: pdfResearch Needs for Circuit Design
Research Needs for Circuit Design Page 1 of 9 January 31, 2001 Rev 2 Research Needs for Circuit Design 2000 Task Force on Circuit Design, SRC Design Sciences Semiconductor Research ...
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26: pdf2002-2007 ICSS Research Needs Document
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28: 2007 GRC compelling research reasons - SRC
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